CiKN1 and CiKN6 are involved in leaf development in citrus by regulating CimiR164
Zeng, Ren‐Fang, Fu, Li‐Ming, Deng, Luo, Liu, Mei‐Feng, Gan, Zhi‐Meng, Zhou, Huan, Hu, Si‐Fan, Hu, Chun‐Gen, Zhang, Jin‐Zhi
Published in The Plant journal : for cell and molecular biology (01.05.2022)
Published in The Plant journal : for cell and molecular biology (01.05.2022)
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A systematic review on reporting quality of economic evaluations for negotiated glucose-lowering drugs in China national reimbursement drug list
Bao, Shi-Yi, Liu, Liu, Li, Fu-Ming, Yang, Yi, Wei, Yan, Shao, Hui, Ming, Jian, Yan, Jun-Tao, Chen, Ying-Yao
Published in BMC health services research (01.05.2024)
Published in BMC health services research (01.05.2024)
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Journal Article
Improvement in Reliability of Tunneling Field-Effect Transistor With p-n-i-n Structure
Wei Cao, Yao, C J, Jiao, G F, Daming Huang, Yu, H Y, Ming-Fu Li
Published in IEEE transactions on electron devices (01.07.2011)
Published in IEEE transactions on electron devices (01.07.2011)
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Journal Article
n-MOSFET With Silicon-Carbon Source/Drain for Enhancement of Carrier Transport
King-Jien Chui, Kah-Wee Ang, Balasubramanian, N., Ming-Fu Li, Samudra, G.S., Yee-Chia Yeo
Published in IEEE transactions on electron devices (01.02.2007)
Published in IEEE transactions on electron devices (01.02.2007)
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Journal Article
Spatial Distribution of Charge Traps in a SONOS-Type Flash Memory Using a High- k Trapping Layer
GANG ZHANG, WANG, Xin-Peng, WON JONG YOO, LI, Ming-Fu
Published in IEEE transactions on electron devices (01.12.2007)
Published in IEEE transactions on electron devices (01.12.2007)
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Journal Article
PBTI Investigation of MoS2 n-MOSFET With Al2O3 Gate Dielectric
Hui-Wen Yuan, Hui Shen, Jun-Jie Li, Jinhai Shao, Daming Huang, Yi-Fang Chen, Wang, P. F., Ding, S. J., Chin, Albert, Ming-Fu Li
Published in IEEE electron device letters (01.05.2017)
Published in IEEE electron device letters (01.05.2017)
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Journal Article
Investigation of Traps at MoS2/Al2O3 Interface in nMOSFETs by Low-Frequency Noise
Hui-Wen Yuan, Hui Shen, Jun-Jie Li, Jinhai Shao, Daming Huang, Yi-Fang Chen, Wang, P. F., Ding, S. J., Liu, W. J., Chin, Albert, Ming-Fu Li
Published in IEEE electron device letters (01.04.2016)
Published in IEEE electron device letters (01.04.2016)
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Journal Article
Effect of Interface Traps and Oxide Charge on Drain Current Degradation in Tunneling Field-Effect Transistors
Huang, X Y, Jiao, G F, Cao, W, Huang, D, Yu, H Y, Chen, Z X, Singh, N, Lo, G Q, Kwong, D L, Ming-Fu Li
Published in IEEE electron device letters (01.08.2010)
Published in IEEE electron device letters (01.08.2010)
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Journal Article
Modeling study of the impact of surface roughness on silicon and Germanium UTB MOSFETs
Low, T., Ming-Fu Li, Samudra, G., Yee-Chia Yeo, Chunxiang Zhu, Chin, A., Dim-Lee Kwong
Published in IEEE transactions on electron devices (01.11.2005)
Published in IEEE transactions on electron devices (01.11.2005)
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Journal Article
A Modified Charge-Pumping Method for the Characterization of Interface-Trap Generation in MOSFETs
Daming Huang, Liu, W.J., Zhiying Liu, Liao, C.C., Li-Fei Zhang, Zhenghao Gan, Waisum Wong, Ming-Fu Li
Published in IEEE transactions on electron devices (01.02.2009)
Published in IEEE transactions on electron devices (01.02.2009)
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Journal Article
Fermi pinning-induced thermal instability of metal-gate work functions
Yu, H.Y., Ren, C., Yee-Chia Yeo, Kang, J.F., Wang, X.P., Ma, H.H.H., Ming-Fu Li, Chan, D.S.H., Kwong, D.-L.
Published in IEEE electron device letters (01.05.2004)
Published in IEEE electron device letters (01.05.2004)
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Journal Article
Chloroplast Genomic Resource of Paris for Species Discrimination
Song, Yun, Wang, Shaojun, Ding, Yuanming, Xu, Jin, Li, Ming Fu, Zhu, Shuifang, Chen, Naizhong
Published in Scientific reports (13.06.2017)
Published in Scientific reports (13.06.2017)
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Journal Article
Tuning effective metal gate work function by a novel gate dielectric HfLaO for nMOSFETs
Wang, X.P., Ming-Fu Li, Ren, C., Yu, X.F., Shen, C., Ma, H.H., Chin, A., Zhu, C.X., Jiang Ning, Yu, M.B., Dim-Lee Kwong
Published in IEEE electron device letters (01.01.2006)
Published in IEEE electron device letters (01.01.2006)
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Journal Article
Work Function Tunability of Refractory Metal Nitrides by Lanthanum or Aluminum Doping for Advanced CMOS Devices
Xin Peng Wang, Eu-Jin Lim, A., Hong Yu Yu, Ming-Fu Li, Chi Ren, Wei-Yip Loh, Chun Xiang Zhu, Chin, A., Trigg, A.D., Yee-Chia Yeo, Biesemans, S., Guo-Qiang Lo, Dim-Lee Kwong
Published in IEEE transactions on electron devices (01.11.2007)
Published in IEEE transactions on electron devices (01.11.2007)
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Journal Article
Experimental Studies of Reliability Issues in Tunneling Field-Effect Transistors
Jiao, G F, Chen, Z X, Yu, H Y, Huang, X Y, Huang, D M, Singh, N, Lo, G Q, Kwong, D.-L, Ming-Fu Li
Published in IEEE electron device letters (01.05.2010)
Published in IEEE electron device letters (01.05.2010)
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Journal Article
Gate Tunneling in Nanowire MOSFETs
Cao, W, Shen, C, Cheng, S Q, Huang, D M, Yu, H Y, Singh, N, Lo, G Q, Kwong, D L, Ming-Fu Li
Published in IEEE electron device letters (01.04.2011)
Published in IEEE electron device letters (01.04.2011)
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