The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology
Po-Ying Chen, Shen-Li Chen, Ming-Hsiung Tsai, Jing, M.H., Lin, T.-C., Cheng-Chia Kuo
Published in 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2007)
Published in 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2007)
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Conference Proceeding
The Failure Mode Investigation of Barrier Layer TaN Combined with Al Pad Architecture using in Cu Process
Po-Ying Chen, Shen-Li Chen, Ming-Hsiung Tsai, Jing, M.H., Lin, T.-C.
Published in 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2007)
Published in 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2007)
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Conference Proceeding
Performance-Effective and Contention-Free Broadcasts on Irregular Network with Heterogeneous Workstations
Ching-Hsien Hsu, Ming-Hsiung Tsai, Tai-Lung Chen, Kun-Ming Yu
Published in 2008 The 3rd International Conference on Grid and Pervasive Computing - Workshops (01.05.2008)
Published in 2008 The 3rd International Conference on Grid and Pervasive Computing - Workshops (01.05.2008)
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Conference Proceeding
Dynamic scanning method to clarify the mechanism of WLCSP package reliability issue
Po-Ying Chen, Chwei-Shyong Tsai, Ming-Hsiung Tsai, Heng-Yu Kung, Shen-Li Chen, Jing, M.H., Wen-Kuan Yeh
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
Published in 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (01.10.2008)
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Conference Proceeding
Reliability and Characteristics of Wafer-Level Chip-Scale Packages under Current Stress
Chen, Po-Ying, Kung, Heng-Yu, Lai, Yi-Shao, Tsai, Ming Hsiung, Yeh, Wen-Kuan
Published in Japanese Journal of Applied Physics (01.02.2008)
Published in Japanese Journal of Applied Physics (01.02.2008)
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Journal Article