Study on effect of hydrogen treatment on amorphous carbon film using scanning probe microscopy
Xie, W.G., Chen, Jian, Chen, Jun, Ming, W.W., Deng, S.Z., Xu, N.S.
Published in Ultramicroscopy (01.04.2009)
Published in Ultramicroscopy (01.04.2009)
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Journal Article
Measurement of Field Emission Property on the Individual Silicon Nanowire by Scanning Tunneling Microscopy
Ming, W.W., Jian Chen, She, J.C., Zhou, J., Xie, W.G., Deng, S.Z., Xu, N.S.
Published in 2006 19th International Vacuum Nanoelectronics Conference (01.07.2006)
Published in 2006 19th International Vacuum Nanoelectronics Conference (01.07.2006)
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Conference Proceeding