by SAKABE, Shuji, SCHILLINGER, Helmut, NAKAMURA, Shin-ichi, KUSABA, Mitsuhiro, NAKASHIMA, Nobuaki, ISHIHARA, Nobuo, Nishioka, H., Odajima, W., Ueda, K., Miyazaki, K., Takada, H., KLU, Zhenlin, SARUKURA, Nobuhiko, SEGAWA, Yusaburo, SEMASHKO, V. V., NAVMOV, A. K., KORABLEVA, S. L., ABDULDABIROV, R. YU, DUBINSKII, M. A., Minamitani, Yasushi, Sugitatsu, Atsushi, Minagwa, Tadao, Matsusita, Yoshifumi, Nakatani, Hajime, Inoue, M., Saito, Y., Fujikawa, S., Sato, Y., Haruta, K., Seki, Hirofumi, Takemori, Satoshi, Kuzuu, Nobu, Murahara, Masataka, Oh, C. H., Han, M. H., Lim, C. W., Fujii, T., Nagano, M., Nemoto, K., TAKIZAWA, Minoru, HATAKEYAMA, Sigeo, KONISI, Yasusi, Tateno, M., Kubota, Y., LIU, Zhenlin, Akagawa, Kazuyuki, Wada, Satoshi, Koike, Nobuyuki, Nakamura, Akira, Tashiro, Hideo, Toyoda, Koichi, Ichihashi, Koki, Negishi, Hidehiko, Furuya, Nobuaki
Published in Rēzā kenkyū (1995)

by Minagwa, T., Kohyama, H., Yoshitomo, Y., Miyashita, M., Nagao, E.
Published in 2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena (01.10.2006)