by Yu-Ling Lin, Hsiao-Tsung Yen, Ho-Hsiang Chen, Chewn-Pu Jou, Chin-Wei Kuo, Min-Che Jeng, Fu-Lung Hsuch, Chih-Hua Hsiao, Guo-Wei Huang
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)

by Jeng, Min-Che, Ma, Yutao, Liu, Zhihong
Year of Publication 20.10.2009