Visible-Light-Induced Organophotocatalytic Difunctionallization: Open-Air Hydroxysulfurization of Aryl Alkenes with Aryl Thiols
Hong, Jee Eun, Jung, Yeonghun, Min, Dahye, Jang, Minji, Kim, Soomin, Park, Jiyong, Park, Yohan
Published in Journal of organic chemistry (03.06.2022)
Published in Journal of organic chemistry (03.06.2022)
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Journal Article
Role of inorganic anions in improving the oxidizing capacity of heat-activated peroxymonosulfate: Identification of primary degradative pathways
Kim, Yae-Eun, Ahn, Yong-Yoon, Kim, Minjeong, Choi, Jaemin, Min, Dahye, Kim, Jaesung, Moon, Gun-Hee, Lee, Jaesang
Published in Chemical engineering journal (Lausanne, Switzerland : 1996) (15.12.2023)
Published in Chemical engineering journal (Lausanne, Switzerland : 1996) (15.12.2023)
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Journal Article
Potential of homogeneous persulfate activation as a strategy for the oxidative treatment of tetramethylammonium hydroxide: Superiority of sulfate radical over hydroxyl radical in the oxidation of methylammoniums
Choi, Wooseok, Min, Dahye, Kim, Minjeong, Park, Cheolwoo, Choi, Yegyun, Kim, Jaesung, Ahn, Yong-Yoon, Yun, Eun-Tae, Lee, Yunho, Lee, Changha, Kim, Wooyul, Lee, Jaesang
Published in Chemical engineering journal (Lausanne, Switzerland : 1996) (01.11.2024)
Published in Chemical engineering journal (Lausanne, Switzerland : 1996) (01.11.2024)
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Journal Article
SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET
Uemura, Taiki, Lee, Soonyoung, Min, Dahye, Moon, Ihlhwa, Lee, Seungbae, Pae, Sangwoo
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit
Uemura, Taiki, Lee, Soonyoung, Min, Dahye, Moon, Ihlhwa, Lim, Jungman, Lee, Seungbae, Sagong, Hyun Chul, Pae, Sangwoo
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding