Radiation Hardness Characterization of a 130nm ASIC Library Technology
Dumitru, Radu, Hafer, Craig, Tzu-Wen Wu, Rominger, Rob, Gardner, Harry, Milliken, Peter, Bruno, Kevin, Farris, Teresa
Published in 2010 IEEE Radiation Effects Data Workshop (01.07.2010)
Published in 2010 IEEE Radiation Effects Data Workshop (01.07.2010)
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