High-Temperature Time-Dependent Gate Breakdown of p-GaN HEMTs
Millesimo, M., Fiegna, C., Posthuma, N., Borga, M., Bakeroot, B., Decoutere, S., Tallarico, A. N.
Published in IEEE transactions on electron devices (01.11.2021)
Published in IEEE transactions on electron devices (01.11.2021)
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Journal Article
Role of the GaN-on-Si Epi-Stack on Δ R ON Caused by Back-Gating Stress
Millesimo, M., Borga, M., Valentini, L., Bakeroot, B., Posthuma, N., Vohra, A., Decoutere, S., Fiegna, C., Tallarico, A. N.
Published in IEEE transactions on electron devices (01.10.2023)
Published in IEEE transactions on electron devices (01.10.2023)
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Journal Article
The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs
Millesimo, M., Borga, M., Bakeroot, B., Posthuma, N., Decoutere, S., Sangiorgi, E., Fiegna, C., Tallarico, A. N.
Published in IEEE electron device letters (01.11.2022)
Published in IEEE electron device letters (01.11.2022)
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Journal Article
A Convolutional-Transformer Model for FFR and iFR Assessment From Coronary Angiography
Mineo, Raffaele, Salanitri, F. Proietto, Bellitto, G., Kavasidis, I., Filippo, O. De, Millesimo, M., Ferrari, G. M. De, Aldinucci, M., Giordano, D., Palazzo, S., D'Ascenzo, F., Spampinato, C.
Published in IEEE transactions on medical imaging (01.08.2024)
Published in IEEE transactions on medical imaging (01.08.2024)
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Journal Article
TCAD Modeling of the Dynamic V TH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs
Tallarico, A. N., Millesimo, M., Bakeroot, B., Borga, M., Posthuma, N., Decoutere, S., Sangiorgi, E., Fiegna, C.
Published in IEEE transactions on electron devices (01.02.2022)
Published in IEEE transactions on electron devices (01.02.2022)
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Journal Article
Analysis of RTN Induced by Forward Gate Stress in GaN HEMTs with a Schottky p-GaN Gate
Millesimo, M., Fiegna, C., Bakeroot, B., Borga, M., Posthuma, N., Decoutere, S., Sangiorgi, E., Tallarico, A. N.
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
P-GaN Gate HEMTs: A Solution to Improve the High-Temperature Gate Lifetime
Tallarico, A. N., Millesimo, M., Borga, M., Bakeroot, B., Posthuma, N., Cosnier, T., Decoutere, S., Sangiorgi, E., Fiegna, C.
Published in IEEE electron device letters (01.09.2024)
Published in IEEE electron device letters (01.09.2024)
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Journal Article
Vascular access in cardiac implantable electronic devices: a systematic review and network meta-analysis
Castagno, D, Saglietto, A, Peddis, M, Falasconi, G, Millesimo, M, Ferraris, F, Anselmino, M, Matta, M, De Ferrari, G M
Published in European heart journal (09.11.2023)
Published in European heart journal (09.11.2023)
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Journal Article
Role of the GaN-on-Si Epi-Stack on \Delta \textit} Caused by Back-Gating Stress
Millesimo, M., Borga, M., Valentini, L., Bakeroot, B., Posthuma, N., Vohra, A., Decoutere, S., Fiegna, C., Tallarico, A. N.
Published in IEEE transactions on electron devices (18.08.2023)
Published in IEEE transactions on electron devices (18.08.2023)
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Journal Article
Asymptomatic Brugada patients: long-term prognosis from a large prospective study
Giustetto, C, Gaita, F, Cerrato, N, Martino, A M, Millesimo, M, Saglietto, A, Bonacchi, G, Barbonaglia, L, Bianchi, F, De Ferrari, G M, Calo', L
Published in European heart journal (09.11.2023)
Published in European heart journal (09.11.2023)
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Journal Article
TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs
Tallarico, A. N., Millesimo, M., Bakeroot, B., Borga, M., Posthuma, N., Decoutere, S., Sangiorgi, E., Fiegna, C.
Published in IEEE transactions on electron devices (01.02.2022)
Published in IEEE transactions on electron devices (01.02.2022)
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Journal Article
Role of the implantable loop recorder in clinical practice: insights on indications, diagnostic yield and therapeutic implications from a single, high volume, tertiary care centre experience
Castagno, D, Ferraris, F, Anselmino, M, Millesimo, M, Saglietto, A, Matta, M, Verna, D, Donadoni, M, Ruffini, S, Giustetto, C, De Ferrari, G M
Published in Europace (London, England) (24.05.2023)
Published in Europace (London, England) (24.05.2023)
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Journal Article
Group A streptococci. Erythromycin resistance and penicillin tolerance
Savoia, D, Millesimo, M, Dotti, G, Milano, F
Published in Advances in experimental medicine and biology (1997)
Published in Advances in experimental medicine and biology (1997)
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Journal Article
Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition
Millesimo, M., Bakeroot, B., Borga, M., Posthuma, N., Decoutere, S., Sangiorgi, E., Fiegna, C., Tallarico, A. N.
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Protective role of the pefloxacin-IFN-gamma association in Leishmania major-infected mice
Zucca, M, Millesimo, M, Giovarelli, M, Diverio, D, Musso, T, Savoia, D
Published in The New microbiologica (01.01.1996)
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Published in The New microbiologica (01.01.1996)
Journal Article
A one-year survey of respiratory and urinary pathogens and their antimicrobial susceptibility
Savoia, D, Ricatto, I, Millesimo, M, De Intinis, G, Daglio, C
Published in The New microbiologica (01.01.1996)
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Published in The New microbiologica (01.01.1996)
Journal Article
Human Monocytes Constitutively Express Membrane-Bound, Biologically Active, and Interferon-γ–Upregulated Interleukin-15
Musso, Tiziana, Calosso, Liliana, Zucca, Mario, Millesimo, Maura, Ravarino, Daniela, Giovarelli, Mirella, Malavasi, Fabio, Ponzi, Alessandro Negro, Paus, Ralf, Bulfone-Paus, Silvia
Published in Blood (15.05.1999)
Published in Blood (15.05.1999)
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Journal Article