Method and apparatus for measuring object thickness
CHANG, YU, HUSTON, JOEL, MILLER, G. LAURIE, LEI, LAWRENCE C, PHAM, QUYEN
Year of Publication 01.11.2007
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Year of Publication 01.11.2007
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METHOD AND APPARATUS FOR MEASURING THICKNESS OF A TEST OBJECT BETWEEN TWO EDDY CURRENT SENSOR HEADS
CHANG YU, LEI LAWRENCE C, MARTNER CECILIA, HUSTON JOEL, PHAM QUYEN, MILLER G. LAURIE, LU SIQING, GU YU PING, SMITH PAUL
Year of Publication 26.08.2005
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Year of Publication 26.08.2005
Patent
METHOD AND APPARATUS FOR MEASURING THICKNESS OF A TEST OBJECT BETWEEN TWO EDDY CURRENT SENSOR HEADS
QUYEN PHAM, CECILIA MARTNER, PAUL SMITH, LAWRENCE, C. LEI, YU CHANG, JOEL HUSTON, SIQING LU, YU, PING GU, G., LAURIE MILLER
Year of Publication 09.07.2004
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Year of Publication 09.07.2004
Patent
Method and apparatus for measuring object thickness
CECILIA MARTNER, CHANG, YU, YU PING GU, PAUL SMITH, HUSTON, JOEL, SIQING LU, MILLER, G. LAURIE, LEI, LAWRENCE C, PHAM, QUYEN
Year of Publication 16.08.2004
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Year of Publication 16.08.2004
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