Tunnel Oxide Nitridation Effect on the Evolution of V Instabilities (RTS/QED) and Defect Characterization for Sub-40-nm Flash Memory
Taehoon Kim, Deping He, Morinville, K., Sarpatwari, K., Millemon, B., Goda, A., Kessenich, J.
Published in IEEE electron device letters (01.08.2011)
Published in IEEE electron device letters (01.08.2011)
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