by Reithmaier, J.P., Deubert, S., Somers, A., Kaiser, W., Forchel, A., Auzanneau, S., Calligaro, M., Michel, N., Bansropun, S., Krakowski, M., Sumpf, B., Erbert, G., Fricke, J., Trankle, G., Hadass, D., Bilenca, A., Dery, H., Mikhelashvili, B., Eisenstein, G.
Published in The 17th Annual Meeting of the IEEELasers and Electro-Optics Society, 2004. LEOS 2004 (2004)