by Karunasiri, R.P.G., Mii, Y.J., Wang, K.L.
Published in IEEE electron device letters (01.05.1990)

by Ping Liu, Wang, J, Phan, M, Garg, M, Zhang, R, Cassier, A, Chua-Eoan, L, Andreev, B, Weyland, S, Ekbote, S, Han, M, Fischer, J, Yeap, Geoffrey C.-F, Ping-Wei Wang, Li, Q, Hou, C S, Lee, S B, Wang, Y F, Lin, S S, Cao, M, Mii, Y J
Published in 2010 Symposium on VLSI Technology (01.06.2010)

by Wu, C.C., Leung, Y.K., Chang, C.S., Tsai, M.H., Huang, H.T., Lin, D.W., Sheu, Y.M., Hsieh, C.H., Liang, W.J., Han, L.K., Chen, W.M., Chang, S.Z., Wu, S.Y., Lin, S.S., Lin, H.C., Wang, C.H., Wang, P.W., Lee, T.L., Fu, C.Y., Chang, C.W., Chen, S.C., Jang, S.M., Shue, S.L., Lin, H.T., See, Y.C., Mii, Y.J., Diaz, C.H., Lin, B.J., Liang, M.S., Sun, Y.C.
Published in Digest. International Electron Devices Meeting (2002)

by Burghartz, J.N., Mii, Y.-J.
Published in IEEE electron device letters (01.07.1993)

by Wu, B.J., Mii, Y.J., Chen, M., Wang, K.L., Murray, J.J.
Published in Journal of crystal growth (01.05.1991)

by VOLKERT, C. A, FITZGERALD, E. A, HULL, R, XIE, Y. H, MII, Y. J
Published in Journal of electronic materials (01.10.1991)

by Hung Yi Huang, Hsieh, C H, Jeng, S M, Tao, H J, Min Cao, Mii, Y J
Published in 2010 IEEE International Interconnect Technology Conference (01.06.2010)

by Pan, S C, Chi, C C, Ko, C C, Kuo, H H, Huang, F M, Lee, S C, Lin, M H, Huang, H Y, Hsieh, C H, Jeng, S M, Tao, H J, Min Cao, Mii, Y J
Published in 2010 IEEE International Interconnect Technology Conference (01.06.2010)

by Nallapati, G., Zhu, J., Wang, J., Sheu, J. Y., Cheng, K. L., Gan, C., Yang, D., Cai, M., Cheng, J., Ge, L., Chen, Y., Bucki, R., Bowers, B., Vang, F., Chen, X., Kwon, O., Yoon, S., Wu, C. C., Chidambaram, Pr, Cao, M., Fischer, J., Terzioglu, E., Mii, Y. J., Yeap, G.
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)

by Yang, S. H., Sheu, J. Y., Ieong, M. K., Chiang, M. H., Yamamoto, T., Liaw, J. J., Chang, S. S., Lin, Y. M., Hsu, T. L., Hwang, J. R., Ting, J. K., Wu, C. H., Ting, K. C., Yang, F. C., Liu, C. M., Wu, I. L., Chen, Y. M., Chent, S. J., Chen, K. S., Cheng, J. Y., Tsai, M. H., Chang, W., Chen, R., Chen, C. C., Lee, T. L., Lin, C. K., Yang, S. C., Sheu, Y. M., Tzeng, J. T., Lu, L. C., Jang, S. M., Diaz, C. H., Mii, Y.
Published in 2011 IEEE Custom Integrated Circuits Conference (CICC) (01.09.2011)

by Wu, C.C., Cheng, M.L., Li, T.H., Lin, Y.C., Yang, L.Y., Lin, C.P., Hou, C.S., Lin, H.C., Yang, J.L., Yu, K.F., Chen, M.J., Lin, D.W., Hsieh, T.H., Peng, Y.C., Chou, C.H., Lee, C.J., Huang, C.W., Lu, C.Y., Yang, F.K., Chen, H.K., Weng, L.W., Yen, P.C., Keshavarzi, A., Wang, S.H., Chang, S.W., Chuang, S.W., Gan, T.C., Wu, T.L., Lee, T.Y., Huang, W.S., Huang, Y.J., Tseng, Y.W., Wu, C.M., Huang, C.H., Ou-Yang, Eric, Hsu, K.Y., Lin, L.T., Wang, S.B., Kwok, T.M., Su, C.C., Tsai, C.H., Huang, M.J., Lin, H.M., Chang, A.S., Chan, C.T., Liao, S.H., Chen, L.S., Chen, J.H., Lim, P.S., Yu, X.F., Ku, S.Y., Lee, Y.B., Hsieh, P.C., Wang, P.W., Chiu, Y.H., Tseng, C.H., Lin, S.S., Tao, H.J., Cao, M., Mii, Y.J., Chen, C.L., Hsieh, C.Y., Wong, K.Y.
Published in 2010 International Electron Devices Meeting (01.12.2010)

by Taur, Y, Cohen, S, Wind, S, Lii, T, Hsu, C, Quinlan, D, Chang, C A, Buchanan, D, Agnello, P, Mii, Y-J, Reeves, C, Acovic, A, Kesan, V
Published in IEEE electron device letters (01.06.1993)

by Taur, Y., Cohen, S., Wind, S., Lii, T., Hsu, C., Quinlan, D., Chang, C.A., Buchanan, D., Agnello, P., Mii, Y.-J., Reeves, C., Acovic, A., Kesan, V.
Published in IEEE electron device letters (01.06.1993)

by Wu, L., Yu, H. Y., Pey, K. L., Pan, J. S., Tuominen, M., Tois, Eva, Lee, D. Y., Hsu, K. Y., Huang, K. T., Tao, H. J., Mii, Y. J.
Published in Electrochemical and solid-state letters (2010)

by Yu, H.Y., Chang, S.Z., Aoulaiche, M., Kaczer, B., Absil, P., Adelmann, C., Hoffmann, T., Biesemans, S., Wann, C., Mii, Y.J.
Published in 2009 International Symposium on VLSI Technology, Systems, and Applications (01.04.2009)

by Fung, S.K.H., Lo, H.C., Cheng, C.F., Lu, W.Y., Wu, K.C., Chen, K.H., Lee, D.H., Liu, Y.H., Wu, I.L., Li, C.T., Wu, C.H., Hsiao, F.L., Chen, T.L., Lien, W.Y., Huang, C.H., Wang, P.W., Chiu, Y.H., Lin, L.T., Chen, K.Y., Tao, H.J., Tuan, H.C., Mii, Y.J., Sun, Y.C.
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)

by Da-Yuan Lee, Chen, C.C., Huang, C.H., Lim, P.S., Chan, M.H., Yeh, M.S., Huang, C.S., Tao, H.J., Mii, Y.J.
Published in 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2008)

by MII; Y. J, CHEN; L. C, LI; M. Y
Year of Publication 15.08.2000

by Sadana, D.K., Mii, Y.-J., Hovel, H.J., Sun, J.Y.-C., Taur, Y., Demic, C., Chan, K., Cohen, S.
Published in Proceedings. IEEE International SOI Conference (1994)

by LO, Cheng-Yao, LIN, Shyue-Shyh, CHEN, Wei-Ming, MII, Yuh-Jier
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)