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py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis
Savitzky, Benjamin H., Zeltmann, Steven E., Hughes, Lauren A., Brown, Hamish G., Zhao, Shiteng, Pelz, Philipp M., Pekin, Thomas C., Barnard, Edward S., Donohue, Jennifer, Rangel DaCosta, Luis, Kennedy, Ellis, Xie, Yujun, Janish, Matthew T., Schneider, Matthew M., Herring, Patrick, Gopal, Chirranjeevi, Anapolsky, Abraham, Dhall, Rohan, Bustillo, Karen C., Ercius, Peter, Scott, Mary C., Ciston, Jim, Minor, Andrew M., Ophus, Colin
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High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
Tate, Mark W., Purohit, Prafull, Chamberlain, Darol, Nguyen, Kayla X., Hovden, Robert, Chang, Celesta S., Deb, Pratiti, Turgut, Emrah, Heron, John T., Schlom, Darrell G., Ralph, Daniel C., Fuchs, Gregory D., Shanks, Katherine S., Philipp, Hugh T., Muller, David A., Gruner, Sol M.
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A Review of Strain Analysis Using Electron Backscatter Diffraction
Wright, Stuart I., Nowell, Matthew M., Field, David P.
Published in Microscopy and microanalysis (01.06.2011)
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Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching
Ophus, Colin, Zeltmann, Steven E., Bruefach, Alexandra, Rakowski, Alexander, Savitzky, Benjamin H., Minor, Andrew M., Scott, Mary C.
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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and Storage
Nord, Magnus, Webster, Robert W. H., Paton, Kirsty A., McVitie, Stephen, McGrouther, Damien, MacLaren, Ian, Paterson, Gary W.
Published in Microscopy and microanalysis (01.08.2020)
Published in Microscopy and microanalysis (01.08.2020)
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Atom Probe Tomography for the Observation of Hydrogen in Materials: A Review
Chen, Yi-Sheng, Liu, Pang-Yu, Niu, Ranming, Devaraj, Arun, Yen, Hung-Wei, Marceau, Ross K W, Cairney, Julie M
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A Versatile and Reproducible Cryo-sample Preparation Methodology for Atom Probe Studies
Woods, Eric V, Singh, Mahander P, Kim, Se-Ho, Schwarz, Tim M, Douglas, James O, El-Zoka, Ayman A, Giulani, Finn, Gault, Baptiste
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Proliferation of Faulty Materials Data Analysis in the Literature
Linford, Matthew R., Smentkowski, Vincent S., Grant, John T., Brundle, C. Richard, Sherwood, Peter M.A., Biesinger, Mark C., Terry, Jeff, Artyushkova, Kateryna, Herrera-Gómez, Alberto, Tougaard, Sven, Skinner, William, Pireaux, Jean-Jacques, McConville, Christopher F., Easton, Christopher D., Gengenbach, Thomas R., Major, George H., Dietrich, Paul, Thissen, Andreas, Engelhard, Mark, Powell, Cedric J., Gaskell, Karen J., Baer, Donald R.
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Published in Microscopy and microanalysis (01.02.2020)
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Electron-Beam-Induced Carbon Contamination in STEM-in-SEM: Quantification and Mitigation
Hugenschmidt, Milena, Adrion, Katharina, Marx, Aaron, Müller, Erich, Gerthsen, Dagmar
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In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View
Schwarz, Tim M, Woods, Eric, Singh, Mahander P, Chen, Xinren, Jung, Chanwon, Aota, Leonardo S, Jang, Kyuseon, Krämer, Mathias, Kim, Se-Ho, McCarroll, Ingrid, Gault, Baptiste
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Developing and Evaluating Deep Neural Network-Based Denoising for Nanoparticle TEM Images with Ultra-Low Signal-to-Noise
Vincent, Joshua L., Manzorro, Ramon, Mohan, Sreyas, Tang, Binh, Sheth, Dev Y., Simoncelli, Eero P., Matteson, David S., Fernandez-Granda, Carlos, Crozier, Peter A.
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Very-High Dynamic Range, 10,000 Frames/Second Pixel Array Detector for Electron Microscopy
Philipp, Hugh T., Tate, Mark W., Shanks, Katherine S., Mele, Luigi, Peemen, Maurice, Dona, Pleun, Hartong, Reinout, van Veen, Gerard, Shao, Yu-Tsun, Chen, Zhen, Thom-Levy, Julia, Muller, David A., Gruner, Sol M.
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A Dictionary Approach to Electron Backscatter Diffraction Indexing
Chen, Yu H., Park, Se Un, Wei, Dennis, Newstadt, Greg, Jackson, Michael A., Simmons, Jeff P., De Graef, Marc, Hero, Alfred O.
Published in Microscopy and microanalysis (01.06.2015)
Published in Microscopy and microanalysis (01.06.2015)
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Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods
Gault, Baptiste, Klaes, Benjamin, Morgado, Felipe F., Freysoldt, Christoph, Li, Yue, De Geuser, Frederic, Stephenson, Leigh T., Vurpillot, François
Published in Microscopy and microanalysis (01.08.2022)
Published in Microscopy and microanalysis (01.08.2022)
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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization
Paterson, Gary W., Webster, Robert W. H., Ross, Andrew, Paton, Kirsty A., Macgregor, Thomas A., McGrouther, Damien, MacLaren, Ian, Nord, Magnus
Published in Microscopy and microanalysis (01.10.2020)
Published in Microscopy and microanalysis (01.10.2020)
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