Modified Hurkx band-to-band-tunneling model for accurate and robust TCAD simulations
Wong, Hiu-Yung, Dolgos, Denis, Smith, Lee, Mickevicius, Rimvydas V.
Published in Microelectronics and reliability (01.01.2020)
Published in Microelectronics and reliability (01.01.2020)
Get full text
Journal Article
Origin and Control of OFF-State Leakage Current in GaN-on-Si Vertical Diodes
Yuhao Zhang, Min Sun, Hiu-Yung Wong, Yuxuan Lin, Srivastava, Puneet, Hatem, Christopher, Azize, Mohamed, Piedra, Daniel, Lili Yu, Sumitomo, Takamichi, de Braga, Nelson Almeida, Mickevicius, Rimvydas Vidas, Palacios, Tomas
Published in IEEE transactions on electron devices (01.07.2015)
Published in IEEE transactions on electron devices (01.07.2015)
Get full text
Journal Article
(Invited) Power Loss Reduction in Perforated-Channel HFET Switches
Shur, Michael, Gaevski, Mikhail, Gaska, Remis, Simin, Grigory, Wong, Hugh Yung, Braga, Nelson, Mickevicius, Rimvydas
Published in ECS transactions (13.04.2015)
Published in ECS transactions (13.04.2015)
Get full text
Journal Article