Phase stability of the ice XVII-based CO2 chiral hydrate from molecular dynamics simulations
Michl, Jakob, Sega, Marcello, Dellago, Christoph
Published in The Journal of chemical physics (14.09.2019)
Published in The Journal of chemical physics (14.09.2019)
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Journal Article
Single- Versus Multi-Step Trap Assisted Tunneling Currents-Part I: Theory
Schleich, Christian, Waldhor, Dominic, Knobloch, Theresia, Zhou, Weifeng, Stampfer, Bernhard, Michl, Jakob, Waltl, Michael, Grasser, Tibor
Published in IEEE transactions on electron devices (01.08.2022)
Published in IEEE transactions on electron devices (01.08.2022)
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Journal Article
Toward Automated Defect Extraction From Bias Temperature Instability Measurements
Waldhoer, Dominic, Schleich, Christian, Michl, Jakob, Stampfer, Bernhard, Tselios, Konstantinos, Ioannidis, Eleftherios G., Enichlmair, Hubert, Waltl, Michael, Grasser, Tibor
Published in IEEE transactions on electron devices (01.08.2021)
Published in IEEE transactions on electron devices (01.08.2021)
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Journal Article
Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory
Michl, Jakob, Grill, Alexander, Waldhoer, Dominic, Goes, Wolfgang, Kaczer, Ben, Linten, Dimitri, Parvais, Bertrand, Govoreanu, Bogdan, Radu, Iuliana, Waltl, Michael, Grasser, Tibor
Published in IEEE transactions on electron devices (01.12.2021)
Published in IEEE transactions on electron devices (01.12.2021)
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Journal Article
Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices
Waldhoer, Dominic, Schleich, Christian, Michl, Jakob, Grill, Alexander, Claes, Dieter, Karl, Alexander, Knobloch, Theresia, Rzepa, Gerhard, Franco, Jacopo, Kaczer, Ben, Waltl, Michael, Grasser, Tibor
Published in Microelectronics and reliability (01.07.2023)
Published in Microelectronics and reliability (01.07.2023)
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Journal Article
Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part II: Experimental
Michl, Jakob, Grill, Alexander, Waldhoer, Dominic, Goes, Wolfgang, Kaczer, Ben, Linten, Dimitri, Parvais, Bertrand, Govoreanu, Bogdan, Radu, Iuliana, Grasser, Tibor, Waltl, Michael
Published in IEEE transactions on electron devices (01.12.2021)
Published in IEEE transactions on electron devices (01.12.2021)
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Journal Article
Evaluation of the impact of defects on threshold voltage drift employing SiO2 pMOS transistors
Tselios, Konstantinos, Michl, Jakob, Knobloch, Theresia, Enichlmair, Hubert, Ioannidis, Eleftherios G., Minixhofer, Rainer, Grasser, Tibor, Waltl, Michael
Published in Microelectronics and reliability (01.11.2022)
Published in Microelectronics and reliability (01.11.2022)
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Journal Article
Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing
Beckers, Arnout, Michl, Jakob, Grill, Alexander, Kaczer, Ben, Bardon, Marie Garcia, Parvais, Bertrand, Govoreanu, Bogdan, De Greve, Kristiaan, Hiblot, Gaspard, Hellings, Geert
Published in IEEE transactions on nanotechnology (2023)
Published in IEEE transactions on nanotechnology (2023)
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Journal Article
Identifying Defects in Charge Trapping Related Phenomena
Waldhoer, Dominic, Schleich, Christian, Michl, Jakob, Grasser, Tibor
Published in 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) (18.09.2023)
Published in 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) (18.09.2023)
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Conference Proceeding
Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing
Beckers, Arnout, Michl, Jakob, Grill, Alexander, Kaczer, Ben, Bardon, Marie Garcia, Parvais, Bertrand, Govoreanu, Bogdan, De Greve, Kristiaan, Hiblot, Gaspard, Hellings, Geert
Year of Publication 22.12.2022
Year of Publication 22.12.2022
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Journal Article
Comphy v3.0 -- A Compact-Physics Framework for Modeling Charge Trapping Related Reliability Phenomena in MOS Devices
Waldhoer, Dominic, Schleich, Christian, Michl, Jakob, Grill, Alexander, Claes, Dieter, Alexander, Karl, Knobloch, Theresia, Rzepa, Gerhard, Franco, Jacopo, Kaczer, Ben, Waltl, Michael, Grasser, Tibor
Published in arXiv.org (22.12.2022)
Published in arXiv.org (22.12.2022)
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Journal Article