Workload dependent reliability timing analysis flow
Sivadasan, Ajith, Notin, Armelle, Huard, Vincent, Maurin, Etienne, Mhira, Souhir, Cacho, Florian, Anghel, Lorena
Published in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 (01.03.2017)
Published in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 (01.03.2017)
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Conference Proceeding
Dynamic aging compensation and Safety measures in Automotive environment
Mhira, S., Huard, V., Benhassain, A., Cacho, F., Naudet, S., Jain, A., Parthasarathy, C., Bravaix, A.
Published in 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (19.09.2017)
Published in 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) (19.09.2017)
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Conference Proceeding
Journal Article
A Path to Energy Efficiency and Reliability for ICs: Fully Depleted Silicon-on-Insulator (FD-SOI) Devices Offer Many Advantages
Nguyen, Bich-Yen, Flatresse, Philippe, Schaeffer, Jamie, Arnaud, Franck, Mhira, Souhir, Huart, Vincent, Weber, Olivier, Sellier, Manuel, Maleville, Christophe
Published in IEEE solid state circuits magazine (01.01.2018)
Published in IEEE solid state circuits magazine (01.01.2018)
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Journal Article