A 14-nm FinFET Logic CMOS Process Compatible RRAM Flash With Excellent Immunity to Sneak Path
Hsieh, E. Ray, Yen Chen Kuo, Chih-Hung Cheng, Jing Ling Kuo, Meng-Ru Jiang, Jian-Li Lin, Hung-Wen Chen, Chung, Steve S., Chuan-Hsi Liu, Tse Pu Chen, Shih An Huang, Tai-Ju Chen, Cheng, Osbert
Published in IEEE transactions on electron devices (01.12.2017)
Published in IEEE transactions on electron devices (01.12.2017)
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Journal Article
An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET
Hsieh, E Ray, Jiang, Meng-Ru, Lin, Jian-Li, Chung, Steve S., Chen, Tse Pu, Huang, Shih An, Chen, Tai-Ju, Cheng, Osbert
Published in IEEE journal of the Electron Devices Society (01.01.2018)
Published in IEEE journal of the Electron Devices Society (01.01.2018)
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Journal Article
15.9 A 16nm 16Mb Embedded STT-MRAM with a 20ns Write Time, a 1012 Write Endurance and Integrated Margin-Expansion Schemes
Lin, Ku-Feng, Noguchi, Hiroki, Shih, Yi-Chun, Yuh, Perng-Fei, Lee, Yuan-Jen, Chang, Tung-Cheng, Huang, Sheng-Po, Lin, Yu-Fan, Lee, Chun-Ying, Huang, Yen-Hsiang, Tsai, Jui-Che, Adham, Saman, Noel, Peter, Yazdi, Ramin, Gershoig, Marat, Shin, YangJae, Joshi, Vineet, Wong, Ted, Jiang, Meng-Ru, Wu, J. J., Cheng, Chun-Tai, Wang, Yu-Jen, Chuang, Harry, Chih, Yu-Der, Wang, Yih, Chang, Tsung-Yung Jonathan
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
Published in 2024 IEEE International Solid-State Circuits Conference (ISSCC) (18.02.2024)
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Conference Proceeding