Failure Rate Prediction and Accelerated Detection of Anomalous Charge Loss in Flash Memories by Using an Analytical Transient Physics-Based Charge Loss Model
Schuler, Franz, Tempel, Georg, Melzner, Hanno, Jacob, Michael, Hendrickx, Paul, Wellekens, Dirk, Van Houdt, Jan
Published in Japanese Journal of Applied Physics (2002)
Published in Japanese Journal of Applied Physics (2002)
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Journal Article
A Yield Model Incorporating Random and Systematic Yield Part I: Theory
Melzner, H.
Published in 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.05.2008)
Published in 2008 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.05.2008)
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Conference Proceeding
Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening
Kux, Andreas, Ullmann, Rudolf, Kern, Thomas, Strunz, Roland, Melzner, Hanno, Beuven, Stephan, Haase, Andreas
Published in 2014 International Test Conference (01.10.2014)
Published in 2014 International Test Conference (01.10.2014)
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Conference Proceeding
In-situ SEM micromechanical experiments on Dual Damascene Copper test structures for investigation of interfacial properties of copper interconnects
Heyn, Wieland, Melzner, Hanno, Goller, Klaus, Ananiev, Sergey, Clausner, Andre, Zechner, Johannes, Zschech, Ehrenfried
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
Published in 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (15.09.2021)
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Conference Proceeding