Search Results - "Meloni, Mark A" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

MICROWAVE PLASMA SOURCE

MICROWAVE PLASMA SOURCE

by MELONI MARK A
Year of Publication 07.01.2020

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Patent

MICROWAVE PLASMA SOURCE

MICROWAVE PLASMA SOURCE

by MELONI MARK A
Year of Publication 18.01.2019

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Patent

FIBEROPTICALLY-COUPLED MEASUREMENT SYSTEM WITH REDUCED SENSITIVITY TO ANGULARLY-DRIVEN VARIATION OF SIGNALS UPON REFLECTION FROM A WAFER

FIBEROPTICALLY-COUPLED MEASUREMENT SYSTEM WITH REDUCED SENSITIVITY TO ANGULARLY-DRIVEN VARIATION OF SIGNALS UPON REFLECTION FROM A WAFER

by CORLESS JOHN D, MELONI MARK A
Year of Publication 31.08.2020

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Patent

ARRAYED IMAGING SYSTEM AND ASSOCIATED METHOD

ARRAYED IMAGING SYSTEM AND ASSOCIATED METHOD

by CHRISTOPHER J LINNEN, GARY L DUERKSEN, RHODES HOWARD E, TACHIHARA SATORU, DOBBS DENNIS W, HEPP MICHAEL, FAN REGIS S, ROBERT H CORMACK, GEORGE C BARNES IV, MELONI MARK A, VLADISLAV V CHUMACHENKO, SILVEIRA PAULO E X, DONALD COMBS, EDWARD R DOWSKI, SCHWARTZ BRIAN T, JAMES HE, GORAN M RAUKER, INGA TAMAYO, MADER JOHN J, SCEPANOVIC MONDRAG, KENNETH ASHLEY MACON, KENNETH S KUBALA, GREGORY E JOHNSON
Year of Publication 20.08.2015

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Patent

Microwave plasma source

Microwave plasma source

by Meloni, Mark A
Year of Publication 16.02.2021

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Patent

Microwave plasma source

Microwave plasma source

by Meloni, Mark A
Year of Publication 09.06.2020

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Patent

MICROWAVE PLASMA SOURCE

MICROWAVE PLASMA SOURCE

by Meloni, Mark A
Year of Publication 23.05.2019

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Patent

MICROWAVE PLASMA SOURCE

MICROWAVE PLASMA SOURCE

by Meloni, Mark A
Year of Publication 10.01.2019

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Patent

Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer

Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer

by Meloni, Mark A, Corless, John D
Year of Publication 06.10.2020

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Patent

FIBEROPTICALLY-COUPLED MEASUREMENT SYSTEM WITH REDUCED SENSITIVITY TO ANGULARLY-DRIVEN VARIATION OF SIGNALS UPON REFLECTION FROM A WAFER

FIBEROPTICALLY-COUPLED MEASUREMENT SYSTEM WITH REDUCED SENSITIVITY TO ANGULARLY-DRIVEN VARIATION OF SIGNALS UPON REFLECTION FROM A WAFER

by Meloni, Mark A, Corless, John D
Year of Publication 20.08.2020

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Patent

Plasma source, excitation system for excitation of a plasma, and optical monitoring system

Plasma source, excitation system for excitation of a plasma, and optical monitoring system

by MELONI, MARK A
Year of Publication 11.03.2021

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Patent

Microwave plasma source

Microwave plasma source

by MELONI, MARK A
Year of Publication 11.11.2020

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Patent

Plasma source, excitation system for excitation of plasma, and optical monitoring system

Plasma source, excitation system for excitation of plasma, and optical monitoring system

by MELONI MARK A
Year of Publication 07.01.2020

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Patent

Plasma source, excitation system for excitation of a plasma, and optical monitoring system

Plasma source, excitation system for excitation of a plasma, and optical monitoring system

by MELONI, MARK A
Year of Publication 01.01.2020

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Patent

An optical system,a processing system for a workpiece,and a method for monitoring a semiconductor process

An optical system,a processing system for a workpiece,and a method for monitoring a semiconductor process

by MELONI, MARK A, CORLESS, JOHN D
Year of Publication 01.03.2023

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Patent

Microwave plasma source

Microwave plasma source

by MELONI, MARK A
Year of Publication 01.03.2019

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Patent

PLASMA SOURCE, EXCITATION SYSTEM AND METHOD FOR OPERATING EXCITATION SYSTEM

PLASMA SOURCE, EXCITATION SYSTEM AND METHOD FOR OPERATING EXCITATION SYSTEM

by MELONI MARK A
Year of Publication 18.01.2019

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Patent

Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer

Fiberoptically-coupled measurement system with reduced sensitivity to angularly-driven variation of signals upon reflection from a wafer

by MELONI, MARK A, CORLESS, JOHN D
Year of Publication 01.02.2021

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Patent

FIBEROPTICALLY-COUPLED MEASUREMENT SYSTEM WITH REDUCED SENSITIVITY TO ANGULARLY-DRIVEN VARIATION OF SIGNALS UPON REFLECTION FROM WAFER

FIBEROPTICALLY-COUPLED MEASUREMENT SYSTEM WITH REDUCED SENSITIVITY TO ANGULARLY-DRIVEN VARIATION OF SIGNALS UPON REFLECTION FROM WAFER

by CORLESS JOHN D, MELONI MARK A
Year of Publication 28.08.2020

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Patent

Self referencing heterodyne reflectometer and method for implementing

Self referencing heterodyne reflectometer and method for implementing

by Aiyer, Arun Ananth, Meloni, Mark A
Year of Publication 15.09.2009

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Patent