New Insights Into Single Event Transient Propagation in Chains of Inverters-Evidence for Propagation-Induced Pulse Broadening
Ferlet-Cavrois, V., Paillet, P., McMorrow, D., Fel, N., Baggio, J., Girard, S., Duhamel, O., Melinger, J.S., Gaillardin, M., Schwank, J.R., Dodd, P.E., Shaneyfelt, M.R., Felix, J.A.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains
Cavrois, V.F., Pouget, V., McMorrow, D., Schwank, J.R., Fel, N., Essely, F., Flores, R.S., Paillet, P., Gaillardin, M., Kobayashi, D., Melinger, J.S., Duhamel, O., Dodd, P.E., Shaneyfelt, M.R.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
A Single-Event-Hardened Phase-Locked Loop Fabricated in 130 nm CMOS
Loveless, T.D., Massengill, L.W., Bhuva, B.L., Holman, W.T., Reed, R.A., McMorrow, D., Melinger, J.S., Jenkins, P.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Subbandgap laser-induced single event effects: carrier generation via two-photon absorption
McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Pease, R.L.
Published in IEEE transactions on nuclear science (01.12.2002)
Published in IEEE transactions on nuclear science (01.12.2002)
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Journal Article
Three-dimensional mapping of single-event effects using two photon absorption
McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Boulghassoul, Y., Massengill, L.W., Pease, R.L.
Published in IEEE transactions on nuclear science (01.12.2003)
Published in IEEE transactions on nuclear science (01.12.2003)
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Journal Article
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
Warren, K.M., Weller, R.A., Mendenhall, M.H., Reed, R.A., Ball, D.R., Howe, C.L., Olson, B.D., Alles, M.L., Massengill, L.W., Schrimpf, R.D., Haddad, N.F., Doyle, S.E., McMorrow, D., Melinger, J.S., Lotshaw, W.T.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
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Journal Article
Direct measurement of transient pulses induced by laser and heavy ion irradiation in deca-nanometer devices
Ferlet-Cavrois, V., Paillet, P., McMorrow, D., Torres, A., Gaillardin, M., Melinger, J.S., Knudson, A.R., Campbell, A.B., Schwank, J.R., Vizkelethy, G., Shaneyfelt, M.R., Hirose, K., Faynot, O., Jahan, C., Tosti, L.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
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Journal Article
A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops
Loveless, T.D., Massengill, L.W., Bhuva, B.L., Holman, W.T., Casey, M.C., Reed, R.A., Nation, S.A., McMorrow, D., Melinger, J.S.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Demonstration of single-event effects induced by through-wafer two-photon absorption
McMorrow, D., Buchner, S., Lotshaw, W.T., Melinger, J.S., Maher, M., Savage, M.W.
Published in IEEE transactions on nuclear science (01.12.2004)
Published in IEEE transactions on nuclear science (01.12.2004)
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Journal Article
Laser-Induced Current Transients in Silicon-Germanium HBTs
Pellish, J.A., Reed, R.A., McMorrow, D., Melinger, J.S., Jenkins, P., Sutton, A.K., Diestelhorst, R.M., Phillips, S.D., Cressler, J.D., Pouget, V., Pate, N.D., Kozub, J.A., Mendenhall, M.H., Weller, R.A., Schrimpf, R.D., Marshall, P.W., Tipton, A.D., Niu, G.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS]
McMorrow, D., Melinger, J.S., Buchner, S., Scott, T., Brown, R.D., Haddad, N.F.
Published in IEEE transactions on nuclear science (01.06.2000)
Published in IEEE transactions on nuclear science (01.06.2000)
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Journal Article
Measurement and Analysis of Interconnect Crosstalk Due to Single Events in a 90 nm CMOS Technology
Balasubramanian, A., Amusan, O.A., Bhuva, B.L., Reed, R.A., Sternberg, A.L., Massengill, L.W., McMorrow, D., Nation, S.A., Melinger, J.S.
Published in IEEE transactions on nuclear science (01.08.2008)
Published in IEEE transactions on nuclear science (01.08.2008)
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Journal Article
A New Technique for SET Pulse Width Measurement in Chains of Inverters Using Pulsed Laser Irradiation
Ferlet-Cavrois, V., McMorrow, D., Kobayashi, D., Fel, N., Melinger, J.S., Schwank, J.R., Gaillardin, M., Pouget, V., Essely, F., Baggio, J., Girard, S., Flament, O., Paillet, P., Flores, R.S., Dodd, P.E., Shaneyfelt, M.R., Hirose, K., Saito, H.
Published in IEEE transactions on nuclear science (01.08.2009)
Published in IEEE transactions on nuclear science (01.08.2009)
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Journal Article
Transient Response of Semiconductor Electronics to Ionizing Radiation. Recent Developments in Charge-Collection Measurement
McMorrow, D., Ferlet-Cavrois, V., Paillet, P., Duhamel, O., Baggio, J., Boos, J.B., Melinger, J.S.
Published in IEEE transactions on nuclear science (01.08.2007)
Published in IEEE transactions on nuclear science (01.08.2007)
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Journal Article
Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies
Melinger, J.S., Buchner, S., McMorrow, D., Stapor, W.J., Weatherford, T.R., Campbell, A.B., Eisen, H.
Published in IEEE transactions on nuclear science (01.12.1994)
Published in IEEE transactions on nuclear science (01.12.1994)
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Journal Article
Conference Proceeding
Analysis of the Transient Response of High Performance 50-nm Partially Depleted SOI Transistors Using a Laser Probing Technique
Ferlet-Cavrois, V., Paillet, P., McMorrow, D., Melinger, J.S., Campbell, A.B., Gaillardin, M., Faynot, O., Thomas, O., Barna, G., Giffard, B.
Published in IEEE transactions on nuclear science (01.08.2006)
Published in IEEE transactions on nuclear science (01.08.2006)
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Journal Article
Single-Event Effects on Combinational Logic Circuits Operating at Ultra-Low Power
Casey, M.C., Amusan, O.A., Nation, S.A., Loveless, T.D., Balasubramanian, A., Bhuva, B.L., Reed, R.A., McMorrow, D., Weller, R.A., Alles, M.L., Massengill, L.W., Melinger, J.S., Narasimham, B.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Pulsed Laser Single-Event Effects in Highly Scaled CMOS Technologies in the Presence of Dense Metal Coverage
Balasubramanian, A., McMorrow, D., Nation, S.A., Bhuva, B.L., Reed, R.A., Massengill, L.W., Loveless, T.D., Amusan, O.A., Black, J.D., Melinger, J.S., Baze, M.P., Ferlet-Cavrois, V., Gaillardin, M., Schwank, J.R.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Ionization-induced carrier transport in InAlAs/InGaAs high electron mobility transistors
McMorrow, D., Knudson, A.R., Boos, J.B., Doe Park, Melinger, J.S.
Published in IEEE transactions on nuclear science (01.10.2004)
Published in IEEE transactions on nuclear science (01.10.2004)
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Journal Article
Laser Verification of On-Chip Charge-Collection Measurement Circuit
Amusan, O.A., Fleming, P.R., Bhuva, B.L., Massengill, L.W., Witulski, A.F., Balasubramanian, A., Casey, M.C., McMorrow, D., Nation, S.A., Barsun, F., Melinger, J.S., Gadlage, M.J., Loveless, T.D.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article