Performance and reliability features of advanced nonvolatile memories based on discrete traps (silicon nanocrystals, SONOS)
Barbara De Salvo, Gerardi, C., van Schaijk, R., Lombardo, S.A., Corso, D., Plantamura, C., Serafino, S., Ammendola, G., van Duuren, M., Goarin, P., Mei, W.Y., van der Jeugd, K., Baron, T., Gely, M., Mur, P., Deleonibus, S.
Published in IEEE transactions on device and materials reliability (01.09.2004)
Published in IEEE transactions on device and materials reliability (01.09.2004)
Get full text
Magazine Article