Origin of electrically induced defects in monolayer MoS2 grown by chemical vapor deposition
Ansh, Ansh, Patbhaje, Utpreksh, Kumar, Jeevesh, Meersha, Adil, Shrivastava, Mayank
Published in Communications materials (07.02.2023)
Published in Communications materials (07.02.2023)
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Journal Article
Unveiling Unintentional Fluorine Doping in TMDs During the Reactive Ion Etching: Root Cause Analysis, Physical Insights, and Solution
Hemanjaneyulu, Kuruva, Meersha, Adil, Kumar, Jeevesh, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.04.2022)
Published in IEEE transactions on electron devices (01.04.2022)
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Journal Article
Carbon Vacancy Assisted Contact Resistance Engineering in Graphene FETs
Kumar, Jeevesh, Meersha, Adil, Variar, Harsha B., Mishra, Abhishek, Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.04.2022)
Published in IEEE transactions on electron devices (01.04.2022)
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Journal Article
Vacancy Assisted Bilayer Graphene Contact for Monolayer Graphene Channel Devices
Meersha, Adil, Kumar, Jeevesh, Mishra, Abhishek, Variar, Harsha B., Shrivastava, Mayank
Published in IEEE electron device letters (01.04.2023)
Published in IEEE electron device letters (01.04.2023)
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Journal Article
Chalcogen-Assisted Enhanced Atomic Orbital Interaction at TMD-Metal Interface and Sulfur Passivation for Overall Performance Boost of 2-D TMD FETs
Ansh, Shrivastava, Mayank, Kumar, Jeevesh, Sheoran, Gaurav, Variar, Harsha B., Mishra, Ravikesh, Kuruva, Hemanjaneyulu, Meersha, Adil, Mishra, Abhishek, Raghavan, Srinivasan
Published in IEEE transactions on electron devices (01.02.2020)
Published in IEEE transactions on electron devices (01.02.2020)
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Journal Article
A First Principle Insight into Defect Assisted Contact Engineering at the Metal-Graphene and Metal-Phosphorene Interfaces
Kumar, Jeevesh, Meersha, Adil, Ansh, Shrivastava, Mayank
Published in 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2019)
Published in 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2019)
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Conference Proceeding
Unified Mechanism for Graphene FET's Electrothermal Breakdown and Its Implications on Safe Operating Limits
Mishra, Abhishek, Meersha, Adil, Kranthi, N. K., Kumar, Jeevesh, Bellamkonda, N. S. Veenadhari, Variar, Harsha B., Shrivastava, Mayank
Published in IEEE transactions on electron devices (01.05.2021)
Published in IEEE transactions on electron devices (01.05.2021)
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Journal Article
Electrically Tunable Nonlinearity at 3.2 Terahertz in Single-Layer Graphene
Di Gaspare, Alessandra, Balci, Osman, Zhang, Jincan, Meersha, Adil, Shinde, Sachin M., Li, Lianhe, Davies, A. Giles, Linfield, Edmund H., Ferrari, Andrea C., Vitiello, Miriam S.
Published in ACS photonics (20.09.2023)
Published in ACS photonics (20.09.2023)
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Journal Article
Mapping the complex refractive index of single layer graphene on semiconductor or polymeric substrates at terahertz frequencies
Pistore, Valentino, Balci, Osman, Zhang, Jincan, Schinde, Sachin M, Meersha, Adil, Ferrari, Andrea C, Vitiello, Miriam S
Published in 2d materials (01.04.2022)
Published in 2d materials (01.04.2022)
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Journal Article
A Systematic Study on the Hysteresis Behaviour and Reliability of MoS2 FET
Meersha, Adil, Sathyajit, B., Shrivastava, Mayank
Published in 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) (01.01.2017)
Published in 2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) (01.01.2017)
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Conference Proceeding
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs
Kranthi, N. K., Mishra, Abhishek, Meersha, Adil, Variar, Harsha B., Shrivastava, Mayank
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
Published in 2018 IEEE International Reliability Physics Symposium (IRPS) (01.03.2018)
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Conference Proceeding
On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes
Kranthi, Nagothu Karmel, Mishra, Abhishek, Meersha, Adil, Shrivastava, Mayank
Published in 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID) (01.01.2018)
Published in 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID) (01.01.2018)
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Conference Proceeding
First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects
Mishra, Abhishek, Meersha, Adil, Kranthi, N.K., Trivedi, Kruti, Variar, Harsha B., Veenadhari Bellamkonda, N S, Raghavan, Srinivasan, Shrivastava, Mayank
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Record low metal - (CVD) graphene contact resistance using atomic orbital overlap engineering
Meersha, Adil, Variar, H. B., Bhardwaj, K., Mishra, A., Raghavan, S., Bhat, N., Shrivastava, Mayank
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
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Conference Proceeding
Comprehensive Computational Modelling Approach for Graphene FETs
Hemanjaneyulu, Kuruva, Khaneja, Mamta, Meersha, Adil, Variar, Harsha B, Shrivastava, Mayank
Published in 2018 4th IEEE International Conference on Emerging Electronics (ICEE) (01.12.2018)
Published in 2018 4th IEEE International Conference on Emerging Electronics (ICEE) (01.12.2018)
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Conference Proceeding
Chalcogen Assisted Enhanced Atomic Orbital Interaction at TMDs - Metal Interface & Chalcogen Passivation of TMD Channel For Overall Performance Boost of 2D TMD FETs
Ansh, Kumar, Jeevesh, Sheoran, Gaurav, Variar, Harsha B, Mishra, Ravi K, Kuruva, Hemanjaneyulu, Meersha, Adil, Mishra, Abhishek, Raghavan, Srinivasan, Shrivastava, Mayank
Published in arXiv.org (08.01.2019)
Published in arXiv.org (08.01.2019)
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Journal Article