by Chao, H.H., Ong, S., Tsai, M.Y., Shih, F.W., Hou, J.C.L., Lewis, K.W., Tang, J.Y., Trempel, C.A., Hadsell, R.W., Yu, H.N., Greier, P.F., Franch, R.L., McCormick, P.E., Davis, C.V., Diamond, A.L., Medve, T.J.
Published in IEEE journal of solid-state circuits (01.10.1986)

by Ferris-Prabhu, A.V., Lubart, N.D., Medve, T.J.
Published in Solid-state electronics (1977)

by Chao, H.h., Ong, J. C., Tsai, M., Shih, F.w., Lewis, K.W., F. Tang, J. Y., Trempel, C. A., Yu, H. N., McCormick, P.E., Davis, C. V., Diamond, A. L., Medve, T. J., L. Hou, J. C.
Published in IEEE design & test of computers (01.06.1987)

by Johnson, R.A., Zierak, M.J., Outama, K.B., Bahn, T.C., Joseph, A.J., Cordero, C.N., Malinowski, J., Bard, K.A., Weeks, T.W., Milliken, R.A., Medve, T.J., May, G.A., Chong, W., Walter, K.M., Tempest, S.L., Chau, B.B., Boenke, M., Nelson, M.W., Harame, D.L.
Published in International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) (1998)