Single Event Upset Testing with Relativistic Heavy Ions
Criswell, T. L., Measel, P. R., Wahlin, K. L.
Published in IEEE transactions on nuclear science (01.12.1984)
Published in IEEE transactions on nuclear science (01.12.1984)
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Journal Article
Single Event Upset Sensitivity of Low Power Schottky Devices
Price, W. E., Nichols, D. K., Measel, P. R., Wahlin, K. L.
Published in IEEE transactions on nuclear science (01.01.1982)
Published in IEEE transactions on nuclear science (01.01.1982)
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Journal Article
Use of PuBe source to simulate neutron-induced single event upsets in static RAMs
Normand, E., Wert, J.L., Doherty, W.R., Oberg, D.L., Measel, P.R., Criswell, T.L.
Published in IEEE transactions on nuclear science (01.12.1988)
Published in IEEE transactions on nuclear science (01.12.1988)
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Journal Article
Development of a Hard Microcontroller
Measel, P. R., Sivo, L. L., Quilitz, W. E., Davidson, T. K.
Published in IEEE transactions on nuclear science (01.12.1976)
Published in IEEE transactions on nuclear science (01.12.1976)
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Journal Article
Radiation Response of Several Memory Device Types
Measel, P. R., Greegor, R. B., Wahlin, K. L.
Published in IEEE transactions on nuclear science (01.01.1980)
Published in IEEE transactions on nuclear science (01.01.1980)
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Journal Article
Measurement of SEU Thresholds and Cross Sections at Fixed Incidence Angles
Criswell, Tommy L., Oberg, Dennis L., Wert, Jerry L., Measel, Paul R., Wilson, W. E.
Published in IEEE transactions on nuclear science (01.12.1987)
Published in IEEE transactions on nuclear science (01.12.1987)
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Journal Article