Quantifying UVA Light Induced Cell Damage via Time-Lapse OIR Microscopy
Landry, S, Girardin, RJ, McGhee, PL, Keeler, WJ
Published in Microscopy and microanalysis (01.08.2007)
Published in Microscopy and microanalysis (01.08.2007)
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State-of-the-art efficiency determination for a Si(Li) X-ray detector in the 3–40 keV energy range
Campbell, J.L., McGhee, P.L.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (01.08.1986)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (01.08.1986)
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Energy-dispersive measurements of the K alpha 3, KM1, K beta 1, and K beta 2 x-ray intensities relative to the K alpha 1 intensity in lead and uranium
Campbell, JL, McGhee, PL, Maxwell, JA, Ollerhead, RW, Whittaker, B
Published in Physical review. A, General physics (01.02.1986)
Published in Physical review. A, General physics (01.02.1986)
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