Design, fabrication and use of mixed-signal IC testability structures
Parker, K.P., McDermid, J.E., Browen, R.A., Nuriya, K., Hirayama, K., Matsuzawa, A.
Published in Proceedings - International Test Conference (1997)
Published in Proceedings - International Test Conference (1997)
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Conference Proceeding
Journal Article
Structure and metrology for an analog testability bus
Parker, K.P., McDermid, J.E., Oresjo, S.
Published in Proceedings of IEEE International Test Conference - (ITC) (1993)
Published in Proceedings of IEEE International Test Conference - (ITC) (1993)
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Conference Proceeding