by Xia, Kejun, McAndrew, Colin C., Grote, Bernhard
Published in IEEE transactions on electron devices (01.04.2016)

by Xia, Kejun, McAndrew, Colin C., Van Langevelde, Ronald
Published in IEEE journal of the Electron Devices Society (2020)

by McAndrew, Colin C.
Published in IEEE transactions on electron devices (01.01.2019)

by Xia, Kejun, McAndrew, Colin C.
Published in IEEE transactions on electron devices (01.10.2021)

by McAndrew, Colin C.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2017)

by McAndrew, Colin C., Hoseini, Mariam, Braswell, Brandt, Garrity, Doug A.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2023)

by Wu, W., Xin Li, Gildenblat, G., Workman, G.O., Veeraraghavan, S., McAndrew, C.C., van Langevelde, R., Smit, G.D.J., Scholten, A.J., Klaassen, D.B.M.
Published in IEEE transactions on electron devices (01.02.2007)

by Xia, Kejun, McAndrew, Colin C., Van Langevelde, Ronald, Smit, Geert D. J., Scholten, Andries J.
Published in IEEE transactions on electron devices (01.12.2019)

by Coram, Geoffrey J., McAndrew, Colin C., Gullapalli, Kiran K., Kundert, Kenneth S.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2020)

by Lu, Luke, Xia, Kejun, van Langevelde, Ronald, McAndrew, Colin C., Li, Wuxia
Published in 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) (15.04.2024)

by Kejun Xia, McAndrew, Colin C., Grote, Bernhard
Published in IEEE transactions on electron devices (01.04.2016)

by McAndrew, C.C.
Published in IEEE transactions on electron devices (01.09.2006)

by McAndrew, Colin C., Coram, Geoffrey J., Gullapalli, Kiran K., Jones, J. Robert, Nagel, Laurence W., Roy, Ananda S., Roychowdhury, Jaijeet, Scholten, Andries J., Smit, Geert D. J., Xufeng Wang, Yoshitomi, Sadayuki
Published in IEEE journal of the Electron Devices Society (01.09.2015)

by Jie, Xiaorui, Langevelde, Ronald van, Xia, Kejun, Chao, Lei, McAndrew, Colin C., Zhang, Qilin, Bacchi, Matthew, Li, Wuxia
Published in 2023 35th International Conference on Microelectronic Test Structure (ICMTS) (27.03.2023)

by Wei Yao, Gildenblat, G., McAndrew, C. C., Cassagnes, A.
Published in IEEE transactions on electron devices (01.03.2012)

by Wei Yao, Gildenblat, G., McAndrew, C. C., Cassagnes, A.
Published in IEEE transactions on electron devices (01.07.2012)

by McAndrew, Colin C., Zunino, Mike, Braswell, Brandt
Published in IEEE transactions on semiconductor manufacturing (01.08.2013)

by Zeqin Zhu, Gildenblat, G., McAndrew, C. C., Ik-Sung Lim
Published in IEEE transactions on electron devices (01.05.2012)

by Tutt, Marcel N., McAndrew, Colin C.
Published in IEEE journal of the Electron Devices Society (01.03.2016)

by Cong Gu, McAndrew, Colin C.
Published in Proceedings of the 2015 International Conference on Microelectronic Test Structures (01.03.2015)