IDDQ and AC scan: the war against unmodelled defects
Maxwell, P.C., Aitken, R.C., Kollitz, K.R., Brown, A.C.
Published in Proceedings International Test Conference 1996. Test and Design Validity (1996)
Published in Proceedings International Test Conference 1996. Test and Design Validity (1996)
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Conference Proceeding
Reductions in quality caused by uneven fault coverage of different areas of an integrated circuit
Maxwell, P.C.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.05.1995)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.05.1995)
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Journal Article
Conference Proceeding
A simulation-based method for estimating defect-free I/sub DDQ
Maxwell, P.C., Rearick, J.R.
Published in Digest of Papers IEEE International Workshop on IDDQ Testing (1997)
Published in Digest of Papers IEEE International Workshop on IDDQ Testing (1997)
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Conference Proceeding
Functional and scan tests: The effectiveness of I/sub DDQ/ how many fault coverages do we need?
Maxwell, P.C., Johansen, V., Inshen Chiang
Published in Proceedings International Test Conference 1992 (1992)
Published in Proceedings International Test Conference 1992 (1992)
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Conference Proceeding
The effect on quality of non-uniform fault coverage and fault probability
Maxwell, P.C., Aitken, R.C., Huisman, L.M.
Published in Proceedings., International Test Conference (1994)
Published in Proceedings., International Test Conference (1994)
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Conference Proceeding
Biased voting: A method for simulating CMOS bridging faults in the presence of variable gate logic thresholds
Maxwell, P.C., Aitken, R.C.
Published in Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA (1993)
Published in Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA (1993)
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Conference Proceeding
Journal Article
Let's grade all the faults
Maxwell, P.C.
Published in Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA (1993)
Published in Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA (1993)
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Conference Proceeding
Journal Article