Cathodoluminescence Studies of the Inhomogeneities in Sn-doped Ga2O3 Nanowires
Maximenko, S. I, Mazeina, L, Picard, Y. N, Freitas, J. A, Bermudez, V. M, Prokes, S. M
Published in Nano letters (01.09.2009)
Published in Nano letters (01.09.2009)
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Journal Article
Radiation response of multi-quantum well solar cells: Electron-beam-induced current analysis
Maximenko, S. I., Lumb, M. P., Hoheisel, R., Gonzalez, M., Scheiman, D. A., Messenger, S. R., Tibbits, T. N. D., Imaizumi, M., Ohshima, T., Sato, S. I., Jenkins, P. P., Walters, R. J.
Published in Journal of applied physics (28.12.2015)
Published in Journal of applied physics (28.12.2015)
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Journal Article
Thin GaAs Solar Cells For High Irradiation Levels
Maximenko, S. I., Lumb, M. P., Moore, J., Hirst, L. C., Yakes, M. K., Jenkins, P. P.
Published in 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) (01.06.2019)
Published in 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC) (01.06.2019)
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Conference Proceeding
Observation of dislocations in diffused 4H–SiC p-i-n diodes by electron-beam induced current
Maximenko, S., Soloviev, S., Cherednichenko, D., Sudarshan, T.
Published in Journal of applied physics (01.01.2005)
Published in Journal of applied physics (01.01.2005)
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Journal Article
Surface plasmon resonance investigation procedure as a structure sensitive method for SnO2 nanofilms
Grinevich, V.S., Filevska, L.M., Matyash, I.E., Maximenko, L.S., Mischuk, O.N., Rudenko, S.P., Serdega, B.K., Smyntyna, V.A., Ulug, B.
Published in Thin solid films (01.11.2012)
Published in Thin solid films (01.11.2012)
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Journal Article
Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures
Katz, M.B., Twigg, M.E., Maximenko, S.I., Bassim, N.D., Mahadik, N.A., Jernigan, G.G., Canedy, C.L., Abell, J., Affouda, C.A.
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
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Journal Article
Effect of threading screw and edge dislocations on transport properties of 4H–SiC homoepitaxial layers
Maximenko, S. I., Freitas, J. A., Myers-Ward, R. L., Lew, K.-K., VanMil, B. L., Eddy, C. R., Gaskill, D. K., Muzykov, P. G., Sudarshan, T. S.
Published in Journal of applied physics (01.07.2010)
Published in Journal of applied physics (01.07.2010)
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Journal Article
Effect of basal plane dislocations on characteristics of diffused 4H-SiC p-i-n diodes
Grekov, A., Maximenko, S., Sudarshan, T.S.
Published in IEEE transactions on electron devices (01.12.2005)
Published in IEEE transactions on electron devices (01.12.2005)
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Journal Article
FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors
Bassim, N., Aifer, A., Jackson, E., Nolde, J., Affouda, C., Canedy, C., Vurgaftman, I., Meyer, J., Maximenko, S.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article
Towards high efficiency multi-junction solar cells grown on InP Substrates
Gonzalez, M., Lumb, M. P., Yakes, M. K., Bailey, C. G., Tischler, J. G., Hoheisel, R., Abell, J., Vurgaftman, I., Meyer, J., Maximenko, S., Jenkins, P. P., Molina, S. I., Delgado-Gonzalez, F. J., Bahena, D., Ponce, A., Adams, J. G. J., Fuhrer, M., Ekins-Daukes, N., Walters, R. J.
Published in 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) (01.06.2013)
Published in 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) (01.06.2013)
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Conference Proceeding
Nature of luminescence and strain in gallium nitride nanowires
Mastro, M.A., Maximenko, S., Gowda, M., Simpkins, B.S., Pehrsson, P.E., Long, J.P., Makinen, A.J., Freitas, J.A., Hite, J.K., Eddy, C.R., Kim, J.
Published in Journal of crystal growth (01.05.2009)
Published in Journal of crystal growth (01.05.2009)
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Journal Article
Conference Proceeding
Characterization of erbium chloride seeded gallium nitride nanocrystals
Ahn, J., Mastro, M.A., Freitas, J.A., Kim, H.-Y., Holm, R.T., Eddy, C.R., Hite, J., Maximenko, S.I., Kim, J.
Published in Thin solid films (01.12.2008)
Published in Thin solid films (01.12.2008)
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Journal Article
Conference Proceeding
Structure and Orientation Determination of Metal-Oxide Nanostructures by Electron Backscatter Diffraction
Picard, YN, Mazeina, L, Maximenko, S, Freitas, J, Prokes, S, Twigg, ME
Published in Microscopy and microanalysis (01.07.2009)
Published in Microscopy and microanalysis (01.07.2009)
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Journal Article
Application of CL/EBIC-SEM techniques for characterization of irradiation induced defects in triple junction solar cells
Maximenko, S I, Messenger, S R, Cress, C, Gonzalez, M, Freitas, J A, Walters, R J
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
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Conference Proceeding
Characterization of high fluence irradiations on advanced triple junction solar cells
Maximenko, S. I., Messenger, S. R., Hoheisel, R., Scheiman, D., Gonzalez, M., Lorentzen, J., Jenkins, P. P., Walters, R. J.
Published in 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) (01.06.2013)
Published in 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) (01.06.2013)
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Conference Proceeding
Crystallinity Control in Low-Temperature Growth of Poly-Crystalline Ge by Ion Beam Deposition
Maximenko, S. I., Mahadik, N. A., Giussani, A., McClure, E. L., Bailey, C., Hubbard, S. M., Jenkins, P. P., Walters, R. J.
Published in 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) (01.06.2017)
Published in 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) (01.06.2017)
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Conference Proceeding