by Ho, H.L., Steigerwalt, M.D., Walsh, B.L., Doney, T.L., Wildrick, D., McFarland, P.A., Benedict, J., Bard, K.A., Pendleton, D., Lee, J.D., Maurer, S.L., Corrow, B., Sadana, D.K.
Published in International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (2001)