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Upset Testing of LSI Devices

Upset Testing of LSI Devices

by Sivo, L. L., Andrews, J. L., Mathers, H. W.
Published in IEEE transactions on nuclear science (01.01.1979)

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Journal Article

Digital Computer Techniques for Determining Circuit Behavior in a Pulsed Nuclear Environment

Digital Computer Techniques for Determining Circuit Behavior in a Pulsed Nuclear Environment

by Craig, W. E., Mathers, H. W.
Published in IEEE transactions on nuclear science (1963)

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Journal Article