Impact of scaling on soft-error rates in commercial microprocessors
Seifert, N., Xiaowei Zhu, Massengill, L.W.
Published in IEEE transactions on nuclear science (01.12.2002)
Published in IEEE transactions on nuclear science (01.12.2002)
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Journal Article
The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM
Warren, K.M., Weller, R.A., Mendenhall, M.H., Reed, R.A., Ball, D.R., Howe, C.L., Olson, B.D., Alles, M.L., Massengill, L.W., Schrimpf, R.D., Haddad, N.F., Doyle, S.E., McMorrow, D., Melinger, J.S., Lotshaw, W.T.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
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Journal Article
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node
Xiong, Y., Feeley, A., Massengill, L.W., Bhuva, B.L., Wen, S.-J., Fung, R.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Modeling and Mitigating Single-Event Transients in Voltage-Controlled Oscillators
Loveless, T.D., Massengill, L.W., Holman, W.T., Bhuva, B.L.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies
Narasimham, B., Bhuva, B.L., Schrimpf, R.D., Massengill, L.W., Gadlage, M.J., Amusan, O.A., Holman, W.T., Witulski, A.F., Robinson, W.H., Black, J.D., Benedetto, J.M., Eaton, P.H.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Design Techniques to Reduce SET Pulse Widths in Deep-Submicron Combinational Logic
Amusan, O.A., Massengill, L.W., Bhuva, B.L., DasGupta, S., Witulski, A.F., Ahlbin, J.R.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
A Single-Event-Hardened Phase-Locked Loop Fabricated in 130 nm CMOS
Loveless, T.D., Massengill, L.W., Bhuva, B.L., Holman, W.T., Reed, R.A., McMorrow, D., Melinger, J.S., Jenkins, P.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
RHBD techniques for mitigating effects of single-event hits using guard-gates
Balasubramanian, A., Bhuva, B.L., Black, J.D., Massengill, L.W.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
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Journal Article
Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology
Olson, B.D., Amusan, O.A., Dasgupta, S., Massengill, L.W., Witulski, A.F., Bhuva, B.L., Alles, M.L., Warren, K.M., Ball, D.R.
Published in IEEE transactions on nuclear science (01.08.2007)
Published in IEEE transactions on nuclear science (01.08.2007)
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Journal Article
Models and Algorithmic Limits for an ECC-Based Approach to Hardening Sub-100-nm SRAMs
Bajura, M.A., Boulghassoul, Y.., Naseer, R.., DasGupta, S.., Witulski, A.F., Sondeen, J.., Stansberry, S.D., Draper, J.., Massengill, L.W., Damoulakis, J.N.
Published in IEEE transactions on nuclear science (01.08.2007)
Published in IEEE transactions on nuclear science (01.08.2007)
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Journal Article
Three-dimensional mapping of single-event effects using two photon absorption
McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Boulghassoul, Y., Massengill, L.W., Pease, R.L.
Published in IEEE transactions on nuclear science (01.12.2003)
Published in IEEE transactions on nuclear science (01.12.2003)
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Journal Article
Impact of Ion Energy and Species on Single Event Effects Analysis
Reed, R.A., Weller, R.A., Mendenhall, M.H., Lauenstein, J.-M., Warren, K.M., Pellish, J.A., Schrimpf, R.D., Sierawski, B.D., Massengill, L.W., Dodd, P.E., Shaneyfelt, M.R., Felix, J.A., Schwank, J.R., Haddad, N.F., Lawrence, R.K., Bowman, J.H., Conde, R.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Single Event Mechanisms in 90 nm Triple-Well CMOS Devices
Roy, T., Witulski, A.F., Schrimpf, R.D., Alles, M.L., Massengill, L.W.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Effect of Well and Substrate Potential Modulation on Single Event Pulse Shape in Deep Submicron CMOS
DasGupta, S., Witulski, A.F., Bhuva, B.L., Alles, M.L., Reed, R.A., Amusan, O.A., Ahlbin, J.R., Schrimpf, R.D., Massengill, L.W.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing
Amusan, O.A., Massengill, L.W., Baze, M.P., Bhuva, B.L., Witulski, A.F., DasGupta, S., Sternberg, A.L., Fleming, P.R., Heath, C.C., Alles, M.L.
Published in IEEE transactions on nuclear science (01.12.2007)
Published in IEEE transactions on nuclear science (01.12.2007)
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Journal Article
Effects of Total Dose Irradiation on Single-Event Upset Hardness
Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., Dodd, P.E., Baggio, J., Ferlet-Cavrois, V., Paillet, P., Hash, G.L., Flores, R.S., Massengill, L.W., Blackmore, E.
Published in IEEE transactions on nuclear science (01.08.2006)
Published in IEEE transactions on nuclear science (01.08.2006)
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Journal Article