The Concept of Safe Operating Area for Gate Dielectrics: the SiC/SiO2 Case Study
Moens, P., Geenen, F., De Schepper, L., Cano, JF, Lettens, J., Maslougkas, S., Franchi, J., Domeij, M.
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Get full text
Conference Proceeding
Factors affecting the water droplet behavior on mica sheets under the influence of homogeneous electric fields
Maslougkas, S., Danikas, M. G., Sarathi, R., Ghani, Ahmad Basri Bin Abd
Published in 2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE) (01.09.2018)
Published in 2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE) (01.09.2018)
Get full text
Conference Proceeding