BE-TANOS: Feasibility and technology limitations
Ghidini, G., Galbiati, N., Scozzari, C., Sebastiani, A., Piagge, R., Del Vitto, A., Comite, P., Alessandri, M., Tessariol, P., Baldi, I., Moltrasio, E., Mascellino, E.
Published in Microelectronic engineering (01.07.2011)
Published in Microelectronic engineering (01.07.2011)
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Conference Proceeding
Reliability constraints for TANOS memories due to alumina trapping and leakage
Amoroso, S M, Mauri, A, Galbiati, N, Scozzari, C, Mascellino, E, Camozzi, E, Rangoni, A, Ghilardi, T, Grossi, A, Tessariol, P, Compagnoni, C M, Maconi, A, Lacaita, A L, Spinelli, A S, Ghidini, G
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding