The Dependence of Retention Time on Gate Length in UTBOX FBRAM With Different Source/Drain Junction Engineering
Nicoletti, T., Aoulaiche, M., Almeida, L. M., Santos, S. D., Martino, J. A., Veloso, A., Jurczak, M., Simoen, E., Claeys, C.
Published in IEEE electron device letters (01.07.2012)
Published in IEEE electron device letters (01.07.2012)
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Journal Article
Impact of Schottky contacts on p-type back enhanced SOI MOSFETs
Yojo, Leonardo S., Rangel, Ricardo C., Sasaki, Katia R.A., Ortiz-Conde, Adelmo, Martino, João A.
Published in Solid-state electronics (01.07.2020)
Published in Solid-state electronics (01.07.2020)
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Journal Article
Performance Perspective of Gate-All-Around Double Nanosheet CMOS Beyond High-Speed Logic Applications
Simoen, Eddy, Coelho, Carlos H.S., Silva, Vanessa C.P. da, Martino, João A., Agopian, Paula Ghedini Der, Oliveira, Alberto, Cretu, Bogdan, Veloso, Anabela
Published in Journal of Integrated Circuits and Systems (17.09.2022)
Published in Journal of Integrated Circuits and Systems (17.09.2022)
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Journal Article
Analog Figures of Merit of Vertically Stacked Silicon Nanosheets nMOSFETs With Two Different Metal Gates for the Sub-7 nm Technology Node Operating at High Temperatures
Silva, Vanessa C. P., Perina, Welder F., Martino, Joao A., Simoen, Eddy, Veloso, Anabela, Agopian, Paula G. D.
Published in IEEE transactions on electron devices (01.07.2021)
Published in IEEE transactions on electron devices (01.07.2021)
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Journal Article
GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes
Oliveira, Alberto V., Simoen, Eddy, Mitard, Jerome, Agopian, Paula G. D., Martino, Joao A., Langer, Robert, Witters, Liesbeth J., Collaert, Nadine, Thean, Aaron, Claeys, Cor
Published in IEEE electron device letters (01.09.2016)
Published in IEEE electron device letters (01.09.2016)
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Journal Article
Proposal of a process design methodology of Fully depleted SOI nMOSFET using only three photolithograph steps for educational application
Rangel, Ricardo C., Martino, Joao A.
Published in 2014 29th Symposium on Microelectronics Technology and Devices (SBMicro) (01.09.2014)
Published in 2014 29th Symposium on Microelectronics Technology and Devices (SBMicro) (01.09.2014)
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Conference Proceeding
Reconfigurable SOI-MOSFET: Past, Present and Future Applications
Rangel, Ricardo, Sasaki, Kátia, Martino, João A.
Published in Journal of Integrated Circuits and Systems (19.10.2022)
Published in Journal of Integrated Circuits and Systems (19.10.2022)
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Journal Article
Graphene for advanced devices applications
Sivieri, Victor B., Wessely, Pia Juliane, Schwalke, Udo, Agopian, Paula G. D., Martino, Joao A.
Published in 2014 29th Symposium on Microelectronics Technology and Devices (SBMicro) (01.09.2014)
Published in 2014 29th Symposium on Microelectronics Technology and Devices (SBMicro) (01.09.2014)
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Conference Proceeding
The effect of X-Ray radiation dose rate on Triple-Gate SOI FinFETs parameters
Bordallo, Caio C. M., Teixeira, Fernando F., Silveira, Marcilei A. G., Martino, Joao A., Agopian, Paula G. D., Simoen, Eddy, Claeys, Cor
Published in 2014 29th Symposium on Microelectronics Technology and Devices (SBMicro) (01.09.2014)
Published in 2014 29th Symposium on Microelectronics Technology and Devices (SBMicro) (01.09.2014)
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Conference Proceeding
Fabrication and Electrical Characterization of Ultra-Thin Body and BOX (UTBB) Back Enhanced SOI (BESOI) pMOSFET
Rangel, Ricardo Cardoso, Sasaki, Katia R. A., Yojo, Leonardo Shimizu, Martino, João Antonio
Published in Journal of Integrated Circuits and Systems (26.05.2020)
Published in Journal of Integrated Circuits and Systems (26.05.2020)
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Journal Article
Semiconductor film band gap influence on retention time of UTBOX SOI 1T-DRAM using pulsed back gate bias
Sasaki, Katia R. A., Almeida, Luciano M., Nissimoff, Albert, Aoulaiche, Marc, Martino, Joao A., Simoen, Eddy, Claeys, Cor
Published in 28th Symposium on Microelectronics Technology and Devices (SBMicro 2013) (01.09.2013)
Published in 28th Symposium on Microelectronics Technology and Devices (SBMicro 2013) (01.09.2013)
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Conference Proceeding
Fully electron-beam-lithography SOI FinFET
Rangel, Ricardo C., Pojar, Mariana, Seabra, Antonio C., Filho, Sebastiao G. Santos, Martino, Joao A.
Published in 28th Symposium on Microelectronics Technology and Devices (SBMicro 2013) (01.09.2013)
Published in 28th Symposium on Microelectronics Technology and Devices (SBMicro 2013) (01.09.2013)
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Conference Proceeding
Two-sided read window observed on UTBOX SOI 1T-DRAM
Nissimoff, Albert, Sasaki, Katia R. A., Aoulaiche, Marc, Martino, Joao A., Simoen, Eddy, Claeys, Cor
Published in 28th Symposium on Microelectronics Technology and Devices (SBMicro 2013) (01.09.2013)
Published in 28th Symposium on Microelectronics Technology and Devices (SBMicro 2013) (01.09.2013)
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Conference Proceeding
Analysis of the Negative-Bias-Temperature-Instability on Omega-Gate Silicon Nanowire SOI MOSFETs with Different Dimensions
Silva, Vanessa Cristina Pereira da, Wirth, Gilson, Martino, Joao Antonio, Agopian, Paula Ghedini Der
Published in Journal of Integrated Circuits and Systems (31.07.2020)
Published in Journal of Integrated Circuits and Systems (31.07.2020)
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Journal Article