by Lindoso, A., Garcia-Valderas, M., Entrena, L., Morilla, Y., Martin-Holgado, P.
Published in IEEE transactions on nuclear science (01.08.2018)

by Martinez-Alvarez, A., Gonzalez-Montesoro, D., Serrano-Cases, A., Aponte-Moreno, A., Restrepo-Calle, F., Morilla, Y., Martin-Holgado, P., Cuenca-Asensi, S.
Published in IEEE transactions on nuclear science (01.08.2024)

by Pena-Fernandez, M., Lindoso, A., Entrena, L., Garcia-Valderas, M., Morilla, Y., Martin-Holgado, P.
Published in IEEE transactions on nuclear science (01.07.2019)

by Moreno-Pérez, J A, Ruiz-García, I, Martín-Holgado, P, Romero-Maestre, A, Anguiano, M, Vila, R, Carvajal, M A
Published in Sensors (Basel, Switzerland) (06.04.2023)

by Peña-Fernandez, M., Lindoso, A., Entrena, L., Garcia-Valderas, M., Philippe, S., Morilla, Y., Martin-Holgado, P.
Published in Microelectronics and reliability (01.09.2018)

by Ruiz-Garcia, I., Martin-Holgado, P., Escobedo, P., Morilla, Y., Palma, A. J., Carvajal, M. A.
Published in 2023 IEEE 33rd International Conference on Microelectronics (MIEL) (16.10.2023)

by Morilla, Y., Martin-Holgado, P., Romero, A., Labrador, J.A., Fernandez, B., Praena, J., Lindoso, A., Garcia-Valderas, Mario, Pena-Fernandez, M., Entrena, L.
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)