Metal-insulator transition in crystalline V2O3 thin films probed at atomic-scale using emission Mössbauer spectroscopy
Qi, B., Gunnlaugsson, H.P., Ólafsson, S., Gislason, H.P., Thorsteinsson, E.B., Arnalds, U.B., Mantovan, R., Unzueta l, I., Zyabkin, D.V., Ram, K.Bharuth, Johnston, K., Krastev, P.B., Mølholt, T.E., Masenda, H., Martín-Luengo, A.Tarazaga, Naidoo, D., Schell, J.
Published in Thin solid films (30.11.2020)
Published in Thin solid films (30.11.2020)
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