Search Results - "Marrs, Michael" :: K.UTB vyhledávací portál

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Substrate and Passivation Techniques for Flexible Amorphous Silicon-Based X-ray Detectors

by Marrs, Michael A, Raupp, Gregory B
Published in Sensors (Basel, Switzerland) (26.07.2016)

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Control of Threshold Voltage and Saturation Mobility Using Dual-Active-Layer Device Based on Amorphous Mixed Metal-Oxide-Semiconductor on Flexible Plastic Substrates

by Marrs, M. A., Moyer, C. D., Bawolek, E. J., Cordova, R. J., Trujillo, J., Raupp, G. B., Vogt, B. D.
Published in IEEE transactions on electron devices (01.10.2011)

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Kinetic Stress Testing and the Influence of Long-Time Anneals on the Behavior of IZO Thin Film Transistors

by Vemuri, Rajitha N. P., Marrs, Michael A., Alford, Terry L.
Published in IEEE transactions on electron devices (01.05.2013)

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Investigation of defect generation and annihilation in IGZO TFTs during practical stress conditions: illumination and electrical bias

by Vemuri, Rajitha N P, Mathews, Winnie P, Marrs, Michael, Alford, T L
Published in Journal of physics. D, Applied physics (30.01.2013)

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Stability of IZO and a-Si:H TFTs Processed at Low Temperature (200 ^} )

by Kaftanoglu, K, Venugopal, S M, Marrs, M, Dey, A, Bawolek, E J, Allee, D R, Loy, D
Published in Journal of display technology (01.06.2011)

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Design and Measurements of a 480 GHz Metamaterial Flat Lens

by Whitton, Cassandra N., Lu, Daniel, Sriram, Adhitya B., Mauskopf, Philip D., Groppi, Christopher E., Marrs, Michael, Goldsmith, Paul F., Trichopoulos, Georgios C.
Published in IEEE transactions on terahertz science and technology (06.11.2024)

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