Reducing Avoidable Admissions in Rural Palliative Care
Ewald, Dan, Marr, Ken, Van de Mortel, Thea
Published in International journal of integrated care (12.03.2018)
Published in International journal of integrated care (12.03.2018)
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Journal Article
Addressable test structure design enabling parallel testing of reliability devices
DeBruler, Lee, Pretti, Dennis, Violette, Mike, Peterson, Dave, Mujumdar, Salil, Li, Xia, Marr, Ken
Published in 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2018)
Published in 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2018)
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Conference Proceeding
ESD Protection Analysis for 3D NAND Internal Source Plate Discharge Circuit
Davis, James, Mitra, Souvick, Marr, Ken, O'Sullivan, Greg, Cerafogli, Chiara, Rabbani, Tania
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Conference Proceeding
Lacquer-based agroforestry system in western Yunnan, China
CHUNLIN LONG, KUI CAI, MARR, Ken, XIAORONG GUO, ZHIQIN OUYANG
Published in Agroforestry systems (01.02.2003)
Published in Agroforestry systems (01.02.2003)
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Journal Article