Study of Transistor and Product NBTI Lifetime Distributions
Qin, Jin, Yan, Baoguang, Shoshany, Yossi, Roy, Druker, Rahamim, Hezi, Marom, Haim, Bernstein, Joseph B.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)
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Conference Proceeding
DF-RQA practice for SoC [design for reliability and quality assurance]
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Conference Proceeding
Study of Transistor and Product NBTI Lifetime Distributions
Jin Qin, Baoguang Yan, Shoshany, Y., Roy, D., Rahamim, H., Marom, H., Bernstein, J.B.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)
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Conference Proceeding
HBM ESD failures caused by a parasitic pre-discharge current spike
Etherton, M., Axelrod, V., Meuse, T., Miller, J.W., Marom, H.
Published in EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium (01.09.2008)
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Published in EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium (01.09.2008)
Conference Proceeding