Colossal grain boundary strengthening in ultrafine nanocrystalline oxides
Muche, Dereck N.F., Drazin, John W., Mardinly, John, Dey, Sanchita, Castro, Ricardo H.R.
Published in Materials letters (01.01.2017)
Published in Materials letters (01.01.2017)
Get full text
Journal Article
Monochromatic STEM-EELS for Correlating the Atomic Structure and Optical Properties of Two-Dimensional Materials
Zhou, Wu, Dellby, Niklas, Basile, Leonardo, Aoki, Toshihiro, Salafranca, Juan, Mardinly, John, Carpenter, Ray, Krivanek, Ondrej L., Idrobo, Juan-Carlos, Pennycook, Stephen J.
Published in Microscopy and microanalysis (01.08.2014)
Published in Microscopy and microanalysis (01.08.2014)
Get full text
Journal Article
Electron tomography of microelectronic device interconnects
Yang, Qing, Mardinly, John, Kübel, Christian, Nelson, Chris, Kisielowski, Christian
Published in International journal of materials research (12.02.2022)
Published in International journal of materials research (12.02.2022)
Get full text
Journal Article
Analysis of Nanoscale Stress in Strained Silicon Materials and Microelectronics Devices by Energy-Filtered Convergent Beam Electron Diffraction
Zhang, Peng, Istratov, Andrei, He, Haifeng, Ager, Joel, Nelson, Chris, Stach, Eric, Mardinly, John, Kisielowski, Christian, Weber, Eicke, Spence, John
Published in ECS transactions (28.04.2006)
Published in ECS transactions (28.04.2006)
Get full text
Journal Article
Thermodynamic Strengthening of Heterointerfaces in Nanoceramics
Wu, Longjia, Dey, Sanchita, Mardinly, John, Hasan, Md, Castro, Ricardo H. R
Published in Chemistry of materials (10.05.2016)
Published in Chemistry of materials (10.05.2016)
Get full text
Journal Article
Irradiation-induced grain growth and defect evolution in nanocrystalline zirconia with doped grain boundaries
Dey, Sanchita, Mardinly, John, Wang, Yongqiang, Valdez, James A, Holesinger, Terry G, Uberuaga, Blas P, Ditto, Jeff J, Drazin, John W, Castro, Ricardo H R
Published in Physical chemistry chemical physics : PCCP (22.06.2016)
Published in Physical chemistry chemical physics : PCCP (22.06.2016)
Get full text
Journal Article
Irradiation-induced grain growth and defect evolution in nanocrystalline zirconia with doped grain boundariesElectronic supplementary information (ESI) available. See DOI: 10.1039/c6cp01763k
Dey, Sanchita, Mardinly, John, Wang, Yongqiang, Valdez, James A, Holesinger, Terry G, Uberuaga, Blas P, Ditto, Jeff J, Drazin, John W, Castro, Ricardo H. R
Year of Publication 22.06.2016
Year of Publication 22.06.2016
Get full text
Journal Article
Exploring aberration-corrected electron microscopy for compound semiconductors
Smith, David J, Aoki, Toshihiro, Mardinly, John, Zhou, Lin, McCartney, Martha R
Published in Microscopy (01.06.2013)
Published in Microscopy (01.06.2013)
Get more information
Journal Article
Effect of Helium Ion Irradiation on the Tunneling Behavior in Niobium/Aluminum-Aluminum Oxide/Niobium Josephson Junctions
Zhang, T., Kopas, C., Yu, L., Carpenter, R. W., Qader, M. A., Huang, M., Singh, R. K., Mardinly, J., Cantor, R., Rowell, J. M., Newman, N.
Published in IEEE transactions on applied superconductivity (01.08.2013)
Published in IEEE transactions on applied superconductivity (01.08.2013)
Get full text
Journal Article
Electron tomography of microelectronic device interconnects: Dedicated to Professor Dr. Knut Urban on the occasion of his 65th birthday
Yang, Qing, Mardinly, John, Kübel, Christian, Nelson, Chris, Kisielowski, Christian
Published in International journal of materials research (01.07.2006)
Published in International journal of materials research (01.07.2006)
Get full text
Journal Article
Electron tomography of microelectronic device interconnects
Yang, Qing, Mardinly, John, Kübel, Christian, Nelson, Chris, Kisielowski, Christian
Published in International journal of materials research (01.07.2006)
Published in International journal of materials research (01.07.2006)
Get full text
Journal Article
Analysis of Nano-scale Strain Near Shallow Trench Isolation Structures by Energy-filtered Convergent Beam Electron Diffraction
Zhang, P, Mardinly, J, Karpenko, O, Istratov, A, He, H, Ager, J, Nelson, C, Stach, E, Kisielowski, C, Weber, E, Spence, J
Published in Microscopy and microanalysis (01.08.2006)
Published in Microscopy and microanalysis (01.08.2006)
Get full text
Journal Article
HRTEM Image Simulations for the Study of Ultrathin Gate Oxides
Taylor, Seth T., Mardinly, John, O'Keefe, Michael A.
Published in Microscopy and microanalysis (01.10.2002)
Published in Microscopy and microanalysis (01.10.2002)
Get full text
Journal Article
Transmission electron microscopy: A critical analytical tool for ULSI technology
Venables, David, Susnitzky, David W., Mardinly, A. John
Published in AIP conference proceedings (24.11.1998)
Published in AIP conference proceedings (24.11.1998)
Get full text
Journal Article
Preferred Orientation of MnS Inclusions in Rolled Steel
Mardinly, A. John, van Vlack, Lawrence H., Hosford, William F.
Published in Texture, stress and microstructure (01.01.1993)
Published in Texture, stress and microstructure (01.01.1993)
Get full text
Journal Article