Probing impact on pad moisture tightness: A challenge for pad size reduction
Vidal-Dho, Matthias, Hubert, Quentin, Gonon, Patrice, Delorme, Philippe, Jacquot, Jonathan, Marchetti, Maxime, Beauvisage, Ludovic, Moragues, Jean-Michel, Potard, Pascale, Fornara, Pascal, Escales, Jean-Philippe, Sallagoity, Pascal, Pizzuto, Olivier, Maury, Delphine, Mirabel, Jean-Michel
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01.03.2019)
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01.03.2019)
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Conference Proceeding
Coaxial probe manufacturing method for e.g. ultramicroscopy, involves depositing metal layer around and along dielectric substrate to form probe shield and purging layer covering probe tip`s useful part having length of specific micrometers
MARCHETTI MAXIME, CASTAGNE MICHEL, CARBONERO JEAN MOUIS, GASQUET DANIEL
Year of Publication 10.11.2006
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Year of Publication 10.11.2006
Patent