by Yang, Shihao, Liang, Huaguo, Hu, Rong, Yao, Liang, Huang, Zhengfeng, Yi, Maoxiang, Lu, Yingchun
Published in IEEE transactions on circuits and systems. II, Express briefs (01.07.2024)

by Cui, Jianguo, Yi, Maoxiang, Cao, Di, Yao, Liang, Wang, Xinyu, Liang, Huaguo, Huang, Zhengfeng, Qi, Haochen, Ni, Tianming, Lu, Yingchun
Published in IEEE transactions on circuits and systems. II, Express briefs (01.03.2022)

by Yan, Aibin, Huang, Zhengfeng, Yi, Maoxiang, Xu, Xiumin, Ouyang, Yiming, Liang, Huaguo
Published in IEEE transactions on very large scale integration (VLSI) systems (01.06.2017)

by Yan, Aibin, Yang, Kang, Huang, Zhengfeng, Zhang, Jiliang, Cui, Jie, Fang, Xiangsheng, Yi, Maoxiang, Wen, Xiaoqing
Published in IEEE transactions on circuits and systems. II, Express briefs (01.02.2019)

by Chen, Qi, Yi, Maoxiang, Man, Xin
Published in Journal of physics. Conference series (01.07.2021)

by Wang, Xinyu, Liang, Huaguo, Wang, Yanjie, Yao, Liang, Guo, Yang, Yi, Maoxiang, Huang, Zhengfeng, Qi, Haochen, Lu, Yingchun
Published in IEEE transactions on circuits and systems. I, Regular papers (01.02.2021)

by Yi, Maoxiang, Bian, Jingchang, Ni, Tianming, Jiang, Cuiyun, Chang, Hao, Liang, Huaguo
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2019)

by Lu, Yingchun, Wang, Xinyu, Wang, Yanjie, Zhang, Yuan, Yao, Liang, Yi, Maoxiang, Huang, Zhengfeng, Liang, Huaguo
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2021)

by Li, Danqing, Liang, Huaguo, Zhang, Hong, Wang, Yue, Yi, Maoxiang, Lu, Yingchun, Huang, Zhengfeng
Published in Electronics (Basel) (01.12.2023)

by Liu, Guangzhu, Hu, Liqun, Zhong, Guoqiang, Liu, Shixing, Yi, Maoxiang, Zhou, Ruijie, Li, Kai, Cao, Hongrui
Published in IEEE transactions on plasma science (01.05.2020)

by Yongxia, Sheng, Huaguo, Liang, Bao, Fang, Cuiyun, Jiang, Zhengfeng, Huang, Maoxiang, Yi, Yingchun, Lu
Published in Integration (Amsterdam) (01.05.2023)

by Liang, Huaguo, Xu, Xiumin, Huang, Zhengfeng, Jiang, Cuiyun, Lu, Yingchun, Yan, Aibin, Ni, Tianming, Ouyang, Yiming, Yi, Maoxiang
Published in IEEE transactions on nuclear science (01.12.2016)

by Li, Zhenmin, Shen, Ruimin, Yi, Maoxiang, Song, Yukun, Wang, Xiaolei, Du, Gaoming, Huang, Zhengfeng
Published in Micromachines (Basel) (14.02.2023)

by Lu, Yingchun, Hu, Guangzhen, Wang, Jianan, Wang, Hao, Yao, Liang, Liang, Huaguo, Yi, Maoxiang, Huang, Zhengfeng
Published in Journal of electronic testing (01.02.2022)

by Lu, Yingchun, Liang, Huaguo, Yao, Liang, Wang, Xinyu, Qi, Haochen, Yi, Maoxiang, Jiang, Cuiyun, Huang, Zhengfeng
Published in IEEE access (2020)

by Song, Tai, Liang, Huaguo, Sun, Ying, Huang, Zhengfeng, Yi, Maoxiang, Fang, Xiangsheng, Yan, Aibin
Published in 2019 IEEE 37th VLSI Test Symposium (VTS) (01.04.2019)

by Aibin Yan, Zhengfeng Huang, Maoxiang Yi, Jie Cui, Huaguo Liang
Published in 2017 IEEE 35th VLSI Test Symposium (VTS) (01.04.2017)

by MAOXIANG YI, HUAGUO LIANG, LEI ZHANG, WENFA ZHAN
Published in IEEE transactions on very large scale integration (VLSI) systems (01.02.2010)

by Zhang, Hong, Liang, Huaguo, Hu, Jiewen, Shao, Zhiwei, Yi, Maoxiang, Lu, Yingchun, Huang, Zhengfeng
Published in Microelectronics (01.08.2023)

by Yi, Maoxiang, Liang, Huaguo, Zhang, Lei, Zhan, Wenfa
Published in IEEE transactions on very large scale integration (VLSI) systems (01.02.2010)