Monte Carlo simulation study of electron yields from compound semiconductor materials
Hussain, A., Yang, L. H., Zou, Y. B., Mao, S. F., Da, B., Li, H. M., Ding, Z. J.
Published in Journal of applied physics (07.07.2020)
Published in Journal of applied physics (07.07.2020)
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Journal Article
Acceleration of plasma toroidal rotation driven by non-axisymmetric magnetic perturbation fields in the EAST tokamak
Sheng, H., Lyu, B., Sun, Y. W., Li, H. H., Li, Y. Y., Bae, C., Liu, Y. Q., Jin, Y. F., Mao, S. F, Yan, X. T., Xie, P. C., Ma, Q., Wang, H. H., Shi, T. H., Zang, Q., Qian, J. P., Jia, M. N., Chu, N., Ye, C., Chang, Y. Y., Wu, X. M., Zhang, Y. N., Yang, H., Wu, M. F., Ye, M. Y.
Published in Physics of plasmas (01.03.2024)
Published in Physics of plasmas (01.03.2024)
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Journal Article
Quantum-trajectory Monte Carlo method for study of electron-crystal interaction in STEM
Ruan, Z, Zeng, R. G, Ming, Y, Zhang, M, Da, B, Mao, S. F, Ding, Z. J
Published in Physical chemistry chemical physics : PCCP (21.07.2015)
Published in Physical chemistry chemical physics : PCCP (21.07.2015)
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Journal Article
Monte Carlo modeling of surface excitation in reflection electron energy loss spectroscopy spectrum for rough surfaces
Da, B., Mao, S. F., Zhang, G. H., Wang, X. P., Ding, Z. J.
Published in Journal of applied physics (01.08.2012)
Published in Journal of applied physics (01.08.2012)
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Journal Article
A Monte Carlo study of reflection electron energy loss spectroscopy spectrum of a carbon contaminated surface
Da, B., Li, Z. Y., Chang, H. C., Mao, S. F., Ding, Z. J.
Published in Journal of applied physics (28.09.2014)
Published in Journal of applied physics (28.09.2014)
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Journal Article
Monte Carlo simulation of full energy spectrum of electrons emitted from silicon in Auger electron spectroscopy
Cao, N., Da, B., Ming, Y., Mao, S. F., Goto, K., Ding, Z. J.
Published in Surface and interface analysis (01.01.2015)
Published in Surface and interface analysis (01.01.2015)
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Journal Article
Quantification of surface roughness effect on elastically backscattered electrons
Ding, X., Da, B., Gong, J. B., Mao, S. F., Li, H. M., Ding, Z. J.
Published in Surface and interface analysis (01.07.2014)
Published in Surface and interface analysis (01.07.2014)
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Journal Article
Simulation study of the atomic resolution secondary electron imaging
Ruan, Z., Zhang, M., Zeng, R. G., Ming, Y., Da, B., Mao, S. F., Ding, Z. J.
Published in Surface and interface analysis (01.12.2014)
Published in Surface and interface analysis (01.12.2014)
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Journal Article
A Monte Carlo study of the spin polarization of secondary electrons
Mao, S. F., Sun, X., Fang, X. W., Da, B., Ding, Z. J.
Published in Surface and interface analysis (01.06.2012)
Published in Surface and interface analysis (01.06.2012)
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Journal Article
Conference Proceeding
Application of a machine learning method to model-based library approach for critical dimension measurements using CD-SEM
Guo, P, Miao, H, Zou, Y B, Mao, S F, Ding, Z J
Published in Measurement science & technology (01.06.2024)
Published in Measurement science & technology (01.06.2024)
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Journal Article
Influence of surface roughness on elastically backscattered electrons
Da, B., Mao, S. F., Zhang, G. H., Wang, X. P., Ding, Z. J.
Published in Surface and interface analysis (01.06.2012)
Published in Surface and interface analysis (01.06.2012)
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Journal Article
Conference Proceeding
Electron backscattering coefficients for Cr, Co, and Pd solids: A Monte Carlo simulation study
Imtiaz, H. I., Khan, M. S. S., Hussain, A., Mao, S. F., Zou, Y. B., Ding, Z. J.
Published in Journal of applied physics (14.06.2024)
Published in Journal of applied physics (14.06.2024)
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Journal Article