Convolutional Neural Network as a Solution to Segment and Classify High Resolution TEM Images to Obtain 3D Information
Leibovich, M., Manzorro, R., Tan, Mai, Mohan, S., Marcos-Morales, Adrià, Fernandez-Granda, C., Crozier, P. A.
Published in Microscopy and microanalysis (01.08.2022)
Published in Microscopy and microanalysis (01.08.2022)
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