Ferroelectric non-volatile memories for low-voltage, low-power applications
Jones, R.E., Maniar, P.D., Moazzami, R., Zurcher, P., Witowski, J.Z., Lii, Y.T., Chu, P., Gillespie, S.J.
Published in Thin solid films (01.12.1995)
Published in Thin solid films (01.12.1995)
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Conference Proceeding
Memory applications based on ferroelectric and high-permittivity dielectric thin films
Jones, R.E., Zurcher, P., Chu, P., Taylor, D.J., Lii, Y.T., Jiang, B., Maniar, P.D., Gillespie, S.J.
Published in Microelectronic engineering (01.12.1995)
Published in Microelectronic engineering (01.12.1995)
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Phase transition in CaGeO3 perovskite : evidence from X-ray powder diffraction, thermal expansion and heat capacity
LIU, X, WANG, Y, LIEBERMANN, R. C, MANIAR, P. D, NAVROTSKY, A
Published in Physics and chemistry of minerals (01.12.1991)
Published in Physics and chemistry of minerals (01.12.1991)
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Integration of ferroelectric capacitor technology with CMOS
Moazzami, R., Maniar, P.D., Jones, R.E., Mogab, C.J.
Published in Proceedings of 1994 VLSI Technology Symposium (1994)
Published in Proceedings of 1994 VLSI Technology Symposium (1994)
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Ferroelectric PZT Thin Films For Low-voltage Nonvolatile Memory
Moazzami, R., Maniar, P.D., Jones, R.E., Campbell, A.C., Mogab, C.J.
Published in [1993 Proceedings] Fifth Biennial Nonvolatile Memory Technology Review (1993)
Published in [1993 Proceedings] Fifth Biennial Nonvolatile Memory Technology Review (1993)
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Conference Proceeding
Novel methods for the reliability testing of ferroelectric DRAM storage capacitors
Sudhama, C., Khamankaar, R., Kim, J., Jiang, B., Lee, J.C., Maniar, P.D., Jones, R.E., Mogab, C.J.
Published in Proceedings of 1994 IEEE International Reliability Physics Symposium (1994)
Published in Proceedings of 1994 IEEE International Reliability Physics Symposium (1994)
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