Is strain engineering scalable in FinFET era?: Teaching the old dog some new tricks
Nainani, A., Gupta, S., Moroz, V., Munkang Choi, Yihwan Kim, Cho, Y., Gelatos, J., Mandekar, T., Brand, A., Er-Xuan Ping, Abraham, M. C., Schuegraf, K.
Published in 2012 International Electron Devices Meeting (01.12.2012)
Published in 2012 International Electron Devices Meeting (01.12.2012)
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