Investigation of Static Performances of 1.2kV 4H-SiC MOSFETs Fabricated Using All 'Room Temperature' Ion Implantations
Mancini, Stephen A., Jang, Seung Yup, Chen, Zeyu, Kim, Dongyoung, Bialy, Alex, Raghotamacher, Balaji, Dudley, Michael, Mahadik, Nadeemullah, Stahlbush, Robert, Al-Jassim, Mowafak, Sung, Woongje
Published in IEEE journal of the Electron Devices Society (2024)
Published in IEEE journal of the Electron Devices Society (2024)
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Journal Article
Analysis of Basal Plane Dislocation Motion Induced by p+ Ion Implantation Using Synchrotron X-Ray Topography
Peng, Hong Yu, Raghothamachar, Balaji, Liu, Yafei, Dudley, Michael, Chen, Ze Yu, Cheng, Qian Yu, Sung, Woong Je, Mancini, Stephen A., Hu, Shanshan, Jang, Seung Yup
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (06.06.2023)
Published in Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum (06.06.2023)
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Journal Article
Static, Dynamic, and Short-circuit Characteristics of Split-Gate 1.2 kV 4H-SiC MOSFETs
Kim, Dongyoung, DeBoer, Skylar, Mancini, Stephen A, Isukapati, Sundar Babu, Lynch, Justin, Yun, Nick, Morgan, Adam J, Jang, Seung Yup, Sung, Woongje
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Increased 3rd Quadrant Current Handling Capability of 1.2kV 4H-SiC JBS Diode-Integrated MOSFETs (JBSFETs) with Minimal Impact on the Forward Conduction and Blocking Performances
Mancini, Stephen A, Jang, Seung Yup, Kim, Dongyoung, Sung, Woongje
Published in 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (07.11.2021)
Published in 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (07.11.2021)
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Conference Proceeding
Monolithically Integrated >3kV, 20A 4H-SiC BiDFET Utilizing an Accumulation Mode Channel for Improved Output Characteristics
Mancini, Stephen A., Jang, Seung Yup, Binder, Andrew, Floyd, Richard, Kaplar, Robert, Atcitty, Stan, Morgan, Adam J., Sung, Woongje
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
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Conference Proceeding
Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures
Mancini, Stephen A., Yup Jang, Seung, Chen, Zeyu, Kim, Dongyoung, Lynch, Justin, Liu, Yafei, Raghothamachar, Balaji, Kang, Minseok, Agarwal, Anant, Mahadik, Nadeemullah, Stahlbush, Robert, Dudley, Michael, Sung, Woongje
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding