Spectroscopic ellipsometry and raman spectroscopy of Bi1-Sb TeI solid solutions with x≤0.1
Aliev, Z.S., Alizade, E.H., Mammadov, D.A., Jalilli, J.N., Aliyeva, Y.N., Abdullayev, N.A., Ragimov, S.S., Bagirova, S.M., Jahangirov, S., Mamedov, N.T., Chulkov, E.V.
Published in Thin solid films (01.03.2023)
Published in Thin solid films (01.03.2023)
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Journal Article
Free carrier plasma edge and plasmonic excitations in heavily doped surface grated n-type Si
Mamedov, N.T., Alizade, E.H., Bayramov, A.H., Tavkhelidze, A., Mammadov, D.A., Jalilli, J.N., Aliyeva, Y.N., Jahangirli, Z.A., Jangidze, L., Kitoshvili, N.
Published in Thin solid films (30.04.2023)
Published in Thin solid films (30.04.2023)
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Journal Article
Spectroscopic ellipsometry and raman spectroscopy of Bi1-xSbxTeI solid solutions with x≤0.1
Aliev, Z.S., Alizade, E.H., Mammadov, D.A., Jalilli, J.N., Aliyeva, Y.N., Abdullayev, N.A., Ragimov, S.S., Bagirova, S.M., Jahangirov, S., Mamedov, N.T., Chulkov, E.V.
Published in Thin solid films (01.03.2023)
Published in Thin solid films (01.03.2023)
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Journal Article