Next generation defect characterization in nitride HEMTs
Arehart, A. R., Malonis, A. C., Poblenz, C., Pei, Y., Speck, J. S., Mishra, U. K., Ringel, S. A.
Published in Physica status solidi. C (01.07.2011)
Published in Physica status solidi. C (01.07.2011)
Get full text
Journal Article
Monolithically integrated thin film III-V/Si solar panel on wafer for active power management
Pitera, A. J., Hennessy, J., Malonis, A. C., Fitzgerald, E. A., Ringel, S. A.
Published in 2011 37th IEEE Photovoltaic Specialists Conference (01.06.2011)
Published in 2011 37th IEEE Photovoltaic Specialists Conference (01.06.2011)
Get full text
Conference Proceeding
Characterization of traps in AlGaN/GaN HEMTs with a combined large signal network analyzer/deep level optical spectrometer system
Chieh-Kai Yang, Roblin, P., Malonis, A., Arehart, A., Ringel, S., Poblenz, C., Yi Pei, Speck, J., Mishra, U.
Published in 2009 IEEE MTT-S International Microwave Symposium Digest (01.06.2009)
Published in 2009 IEEE MTT-S International Microwave Symposium Digest (01.06.2009)
Get full text
Conference Proceeding
Additive phase noise measurements of AlGaN/GaN HEMTs using a large signal network analyzer and a tunable monochromatic light source
Inwon Suh, Roblin, P., Youngseo Ko, Chieh-Kai Yang, Malonis, A., Arehart, A., Ringel, S., Poblenz, C., Yi Pei, Speck, J., Mishra, U.
Published in 2009 74th ARFTG Microwave Measurement Conference (01.11.2009)
Published in 2009 74th ARFTG Microwave Measurement Conference (01.11.2009)
Get full text
Conference Proceeding